Brennan Peterson

Person

Longmont, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage contrast metrology mark
- Patent number 12,169,366
- Issue date Dec 17, 2024
- ASML Netherlands B.V.
- Cyrus Emil Tabery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 12,112,260
- Issue date Oct 8, 2024
- ASML Netherlands B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window based on defect probability
- Patent number 11,822,255
- Issue date Nov 21, 2023
- ASML Netherlands B.V.
- Abraham Slachter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for inspecting integrated circuits based on X-rays
- Patent number 11,815,349
- Issue date Nov 14, 2023
- Bruker Nano, Inc.
- Brennan Lovelace Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling a manufacturing process and associated appar...
- Patent number 11,187,994
- Issue date Nov 30, 2021
- ASML Netherlands B.V.
- Mohammad Reza Kamali
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing devices
- Patent number 11,087,065
- Issue date Aug 10, 2021
- ASML Netherlands B.V.
- Sunit Sondhi Mahajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process window based on defect probability
- Patent number 11,079,687
- Issue date Aug 3, 2021
- ASML Netherlands B.V.
- Abraham Slachter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Information determining apparatus and method
- Patent number 10,948,837
- Issue date Mar 16, 2021
- ASML Netherlands B.V.
- An Gao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHEMICALLY SELECTIVE ADHESION AND STRENGTH PROMOTERS IN SEMICONDUCT...
- Publication number 20240419079
- Publication date Dec 19, 2024
- Geminatio, Inc.
- Brennan Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus And Method For Determining A Characteristic Of...
- Publication number 20240412067
- Publication date Dec 12, 2024
- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELF-ALIGNED BUILD-UP PROCESSING
- Publication number 20240404828
- Publication date Dec 5, 2024
- Geminatio, Inc.
- Brennan Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSISTED FEATURE PLACEMENT IN SEMICONDUCTOR PATTERNING
- Publication number 20240377749
- Publication date Nov 14, 2024
- Geminatio, Inc.
- Brennan Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOCAL SHADOW MASKING FOR MULTI-COLOR EXPOSURES
- Publication number 20240377744
- Publication date Nov 14, 2024
- Geminatio, Inc.
- Brennan Peterson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PROCESS WINDOW BASED ON DEFECT PROBABILITY
- Publication number 20240126181
- Publication date Apr 18, 2024
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS
- Publication number 20220042795
- Publication date Feb 10, 2022
- SVXR, Inc.
- Brennan Lovelace Peterson
- G01 - MEASURING TESTING
Information Patent Application
PROCESS WINDOW BASED ON DEFECT PROBABILITY
- Publication number 20210356874
- Publication date Nov 18, 2021
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
VOLTAGE CONTRAST METROLOGY MARK
- Publication number 20210088917
- Publication date Mar 25, 2021
- ASML NETHERLANDS B.V.
- Cyrus Emil TABERY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS WINDOW BASED ON DEFECT PROBABILITY
- Publication number 20210018850
- Publication date Jan 21, 2021
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INFORMATION DETERMINING APPARATUS AND METHOD
- Publication number 20200159134
- Publication date May 21, 2020
- ASML NETHERLANDS B.V.
- An GAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEARING OUT METHOD, REVEALING DEVICE, LITHOGRAPHIC APPARATUS, AND...
- Publication number 20200152527
- Publication date May 14, 2020
- ASML NETHERLANDS B.V.
- Andre Bernardus JEUNINK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING DEVICES
- Publication number 20200097633
- Publication date Mar 26, 2020
- ASML NETHERLANDS B.V.
- Sunit Sondhi MAHAJAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic of...
- Publication number 20190378012
- Publication date Dec 12, 2019
- ASML NETHERLANDS B.V.
- Lorenzo Tripodi
- G06 - COMPUTING CALCULATING COUNTING

Brennan Peterson

Person

Patents Grantslast 30 patents

Voltage contrast metrology mark

Metrology apparatus and method for determining a characteristic of...

Process window based on defect probability

Methods and systems for inspecting integrated circuits based on X-rays

Method for controlling a manufacturing process and associated appar...

Method of manufacturing devices

Process window based on defect probability

Information determining apparatus and method

Patents Applicationslast 30 patents

CHEMICALLY SELECTIVE ADHESION AND STRENGTH PROMOTERS IN SEMICONDUCT...

Metrology Apparatus And Method For Determining A Characteristic Of...

SELF-ALIGNED BUILD-UP PROCESSING

ASSISTED FEATURE PLACEMENT IN SEMICONDUCTOR PATTERNING

LOCAL SHADOW MASKING FOR MULTI-COLOR EXPOSURES

PROCESS WINDOW BASED ON DEFECT PROBABILITY

METHODS AND SYSTEMS FOR INSPECTING INTEGRATED CIRCUITS BASED ON X-RAYS

PROCESS WINDOW BASED ON DEFECT PROBABILITY

VOLTAGE CONTRAST METROLOGY MARK

PROCESS WINDOW BASED ON DEFECT PROBABILITY

INFORMATION DETERMINING APPARATUS AND METHOD

CLEARING OUT METHOD, REVEALING DEVICE, LITHOGRAPHIC APPARATUS, AND...

METHOD OF MANUFACTURING DEVICES

Metrology Apparatus and Method for Determining a Characteristic of...