Brent Holcombe

Person

Colorado Springs, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe accessories, and methods for probing test points using same
- Patent number 7,492,173
- Issue date Feb 17, 2009
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing at arbitrary locations within an i...
- Patent number 7,372,284
- Issue date May 13, 2008
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Probe having a frame to align spring pins perpendicularly to a prin...
- Patent number 7,323,892
- Issue date Jan 29, 2008
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Regenerator probe
- Patent number 7,282,935
- Issue date Oct 16, 2007
- Agilent Technologies, Inc.
- Glenn Wood
- G01 - MEASURING TESTING
Information Patent Grant
Signal probe and probe assembly
- Patent number 7,242,202
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Joseph Groshong
- G01 - MEASURING TESTING
Information Patent Grant
Probe retention kit, and system and method for probing a pattern of...
- Patent number 7,242,203
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Incorporation of isolation resistor(s) into probes using probe tip...
- Patent number 7,183,781
- Issue date Feb 27, 2007
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method, and kit for probing a pattern of points on a pri...
- Patent number 7,145,352
- Issue date Dec 5, 2006
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly with controlled impedance spring pin or resistor tip...
- Patent number 7,116,121
- Issue date Oct 3, 2006
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Flexible ribbon probe for peripheral leads of an electronic part's...
- Patent number 7,091,731
- Issue date Aug 15, 2006
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Interposer probe and method for testing
- Patent number 7,064,567
- Issue date Jun 20, 2006
- Agilent Technologies, Inc.
- Donald Earl Schott
- G01 - MEASURING TESTING
Information Patent Grant
Probes with perpendicularly disposed spring pins, and methods of ma...
- Patent number 7,046,020
- Issue date May 16, 2006
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing circuits, and associated methods
- Patent number 6,867,609
- Issue date Mar 15, 2005
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Alignment/retention device for connector-less probe
- Patent number 6,822,466
- Issue date Nov 23, 2004
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Method for constructing a flex-rigid laminate probe
- Patent number 6,750,669
- Issue date Jun 15, 2004
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Integrated ball grid array-pin grid array-flex laminate test assembly
- Patent number 6,638,080
- Issue date Oct 28, 2003
- Agilent Technologies, Inc.
- Kenneth W Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated ball grid array-pin grid array-flex circuit interposing...
- Patent number 6,635,511
- Issue date Oct 21, 2003
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Retention module adapter
- Patent number 6,396,698
- Issue date May 28, 2002
- Agilent Technologies, Inc.
- Brent A. Holcombe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for edge mounting flex media to a rigid PC board
- Patent number 6,378,757
- Issue date Apr 30, 2002
- Agilent Technologies, Inc.
- Brent A. Holcombe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
PROBE HAVING A FRAME TO ALIGN SPRING PINS PERPENDICULARLY TO A PRIN...
- Publication number 20070296425
- Publication date Dec 27, 2007
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for probing at arbitrary locations within an i...
- Publication number 20070176611
- Publication date Aug 2, 2007
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Application
Regenerator probe
- Publication number 20070170936
- Publication date Jul 26, 2007
- Glenn Wood
- G01 - MEASURING TESTING
Information Patent Application
Probe accessories, and methods for probing test point using same
- Publication number 20070159191
- Publication date Jul 12, 2007
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Incorporation of Isolation Resistor(s) into Probes using Probe Tip...
- Publication number 20070115014
- Publication date May 24, 2007
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Signal probe and probe assembly
- Publication number 20060267606
- Publication date Nov 30, 2006
- Joseph Groshong
- G01 - MEASURING TESTING
Information Patent Application
Interposer probe and method for testing
- Publication number 20060033512
- Publication date Feb 16, 2006
- Donald Earl Schott
- G01 - MEASURING TESTING
Information Patent Application
Apparatus, method, and kit for probing a pattern of points on a pri...
- Publication number 20060033513
- Publication date Feb 16, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Incorporation of isolation resistor(s) into probes using probe tip...
- Publication number 20060033514
- Publication date Feb 16, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Probe retention kit, and system and method for probing a pattern of...
- Publication number 20060033518
- Publication date Feb 16, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Backside attach probe, components thereof, and methods for making a...
- Publication number 20060022692
- Publication date Feb 2, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Probes with perpendicularly disposed spring pins, and methods of ma...
- Publication number 20050179454
- Publication date Aug 18, 2005
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Connector-less probe
- Publication number 20040164754
- Publication date Aug 26, 2004
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Application
Electrical connector for interconnection of multiple printed circui...
- Publication number 20030186589
- Publication date Oct 2, 2003
- Brent A. Holcombe
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for constructing a flex-rigid laminate probe
- Publication number 20030006790
- Publication date Jan 9, 2003
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Application
Integrated ball grid array-pin grid array-flex laminate assembly
- Publication number 20030003780
- Publication date Jan 2, 2003
- Kenneth W. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Integrated ball grid array-pin grid array-flex circuit interposing...
- Publication number 20020094672
- Publication date Jul 18, 2002
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Application
Method for constructing a flex-rigid laminate probe
- Publication number 20020093351
- Publication date Jul 18, 2002
- Brent A. Holcombe
- G01 - MEASURING TESTING

Brent Holcombe

Person

Patents Grantslast 30 patents

Probe accessories, and methods for probing test points using same

Method and apparatus for probing at arbitrary locations within an i...

Probe having a frame to align spring pins perpendicularly to a prin...

Regenerator probe

Signal probe and probe assembly

Probe retention kit, and system and method for probing a pattern of...

Incorporation of isolation resistor(s) into probes using probe tip...

Apparatus, method, and kit for probing a pattern of points on a pri...

Probe assembly with controlled impedance spring pin or resistor tip...

Flexible ribbon probe for peripheral leads of an electronic part's...

Interposer probe and method for testing

Probes with perpendicularly disposed spring pins, and methods of ma...

Probe for testing circuits, and associated methods

Alignment/retention device for connector-less probe

Method for constructing a flex-rigid laminate probe

Integrated ball grid array-pin grid array-flex laminate test assembly

Integrated ball grid array-pin grid array-flex circuit interposing...

Retention module adapter

Method for edge mounting flex media to a rigid PC board

Patents Applicationslast 30 patents

PROBE HAVING A FRAME TO ALIGN SPRING PINS PERPENDICULARLY TO A PRIN...

Method and apparatus for probing at arbitrary locations within an i...

Regenerator probe

Probe accessories, and methods for probing test point using same

Incorporation of Isolation Resistor(s) into Probes using Probe Tip...

Signal probe and probe assembly

Interposer probe and method for testing

Apparatus, method, and kit for probing a pattern of points on a pri...

Incorporation of isolation resistor(s) into probes using probe tip...

Probe retention kit, and system and method for probing a pattern of...

Backside attach probe, components thereof, and methods for making a...

Probes with perpendicularly disposed spring pins, and methods of ma...

Connector-less probe

Electrical connector for interconnection of multiple printed circui...

Method for constructing a flex-rigid laminate probe

Integrated ball grid array-pin grid array-flex laminate assembly

Integrated ball grid array-pin grid array-flex circuit interposing...

Method for constructing a flex-rigid laminate probe