Bret Schrayer

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Tampa, FL, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,154,833
- Issue date Nov 26, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor doping characterization method using photoneutralizat...
- Patent number 12,027,430
- Issue date Jul 2, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DOPING CHARACTERIZATION METHOD USING PHOTONEUTRALIZAT...
- Publication number 20240347399
- Publication date Oct 17, 2024
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall D. Wilson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
Charge Metrology for Integrated Measurement
- Publication number 20180315630
- Publication date Nov 1, 2018
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Dmitriy Marinskiy
- H01 - BASIC ELECTRIC ELEMENTS