Brett Allen Pawlanta

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Grand Rapids, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Measuring an appearance property of a surface using a bidirectional...
- Patent number 7,944,561
- Issue date May 17, 2011
- X-Rite, Inc.
- Jon Kenneth Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Measuring an appearance property of a surface using a spatially und...
- Patent number 7,940,396
- Issue date May 10, 2011
- X-Rite, Inc.
- Jon Kenneth Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for profiling and synchronizing a fleet of colo...
- Patent number 7,499,164
- Issue date Mar 3, 2009
- X-Rite, Inc.
- Brett Allen Pawlanta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring an appearance property of a surface using a bidirectional...
- Publication number 20070291993
- Publication date Dec 20, 2007
- Jon Kenneth Nisper
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for profiling and synchronizing a fleet of colo...
- Publication number 20070002324
- Publication date Jan 4, 2007
- Brett Allen Pawlanta
- G01 - MEASURING TESTING
Information Patent Application
Measuring an appearance property of a surface using a spatially und...
- Publication number 20060245632
- Publication date Nov 2, 2006
- Jon Kenneth Nisper
- G01 - MEASURING TESTING
Information Patent Application
Method for processing multiwavelength interferometric imaging data
- Publication number 20060181714
- Publication date Aug 17, 2006
- Coherix, Inc
- Michael J. Mater
- G01 - MEASURING TESTING