Brett Crump

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe interposers and methods of fabricating probe interposers
- Patent number 7,459,923
- Issue date Dec 2, 2008
- Micron Technology, Inc.
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Grant
Planarity diagnostic system, e.g., for microelectronic component te...
- Patent number 7,253,608
- Issue date Aug 7, 2007
- Micron Technology, Inc.
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Planarity diagnostic system, E.G., for microelectronic component te...
- Patent number 7,211,997
- Issue date May 1, 2007
- Micron Technology, Inc.
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Selectively configurable probe structures, e.g., selectively config...
- Patent number 7,170,304
- Issue date Jan 30, 2007
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Grant
Selectively configurable probe structures, e.g., for testing microe...
- Patent number 7,145,355
- Issue date Dec 5, 2006
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Grant
Planarity diagnostic system, e.g., for microelectronic component te...
- Patent number 7,019,512
- Issue date Mar 28, 2006
- Micron Technology, Inc.
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Selectively configurable probe structures, e.g., for testing microe...
- Patent number 6,972,580
- Issue date Dec 6, 2005
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Grant
Selectively configurable probe structures, e.g., for testing microe...
- Patent number 6,952,109
- Issue date Oct 4, 2005
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Grant
Selectively configurable microelectronic probes
- Patent number 6,924,653
- Issue date Aug 2, 2005
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Grant
Planarity diagnostic system, E.G., for microelectronic component te...
- Patent number 6,841,991
- Issue date Jan 11, 2005
- Micron Technology, Inc.
- Michael H. Martin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD FOR TESTING IMAGING DEVICES, AND METHODS OF FABRICATING...
- Publication number 20080044623
- Publication date Feb 21, 2008
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Probe interposers and methods of fabricating probe interposers
- Publication number 20070245552
- Publication date Oct 25, 2007
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
Probe interposers and methods of fabricating probe interposers
- Publication number 20070236233
- Publication date Oct 11, 2007
- John Caldwell
- G01 - MEASURING TESTING
Information Patent Application
PLANARITY DIAGNOSTIC SYSTEM, E.G., FOR MICROELECTRONIC COMPONENT TE...
- Publication number 20070108965
- Publication date May 17, 2007
- Micron Technology, Inc.
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Application
Planarity diagnostic system, E.G., for microelectronic component te...
- Publication number 20060125471
- Publication date Jun 15, 2006
- Micron Technology, Inc.
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe strucutres, e.g., for testing microe...
- Publication number 20050258848
- Publication date Nov 24, 2005
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe structures, e.g., for testing microe...
- Publication number 20050206399
- Publication date Sep 22, 2005
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe structures, e.g., for testing microe...
- Publication number 20050024072
- Publication date Feb 3, 2005
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Application
Planarity diagnostic system, e.g., for microelectronic component te...
- Publication number 20050024040
- Publication date Feb 3, 2005
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe structures, e.g., for testing microe...
- Publication number 20050024071
- Publication date Feb 3, 2005
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Application
Planarity diagnostic system, E.G., for microelectronic component te...
- Publication number 20040041556
- Publication date Mar 4, 2004
- Michael H. Martin
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe structures, e.g., for testing microe...
- Publication number 20040036490
- Publication date Feb 26, 2004
- Ralph Schaeffer
- G01 - MEASURING TESTING

Brett Crump

Person

Patents Grantslast 30 patents

Probe interposers and methods of fabricating probe interposers

Planarity diagnostic system, e.g., for microelectronic component te...

Planarity diagnostic system, E.G., for microelectronic component te...

Selectively configurable probe structures, e.g., selectively config...

Selectively configurable probe structures, e.g., for testing microe...

Planarity diagnostic system, e.g., for microelectronic component te...

Selectively configurable probe structures, e.g., for testing microe...

Selectively configurable probe structures, e.g., for testing microe...

Selectively configurable microelectronic probes

Planarity diagnostic system, E.G., for microelectronic component te...

Patents Applicationslast 30 patents

PROBE CARD FOR TESTING IMAGING DEVICES, AND METHODS OF FABRICATING...

Probe interposers and methods of fabricating probe interposers

Probe interposers and methods of fabricating probe interposers

PLANARITY DIAGNOSTIC SYSTEM, E.G., FOR MICROELECTRONIC COMPONENT TE...

Planarity diagnostic system, E.G., for microelectronic component te...

Selectively configurable probe strucutres, e.g., for testing microe...

Selectively configurable probe structures, e.g., for testing microe...

Selectively configurable probe structures, e.g., for testing microe...

Planarity diagnostic system, e.g., for microelectronic component te...

Selectively configurable probe structures, e.g., for testing microe...

Planarity diagnostic system, E.G., for microelectronic component te...

Selectively configurable probe structures, e.g., for testing microe...