Brian A. Bryce

Person

Chevy Chase, MD, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self-limited crack etch to prevent device shorting
- Patent number 9,559,292
- Issue date Jan 31, 2017
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Piezoelectronic transistor with co-planar common and gate electrodes
- Patent number 9,444,029
- Issue date Sep 13, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passivation and alignment of piezoelectronic transistor piezoresistor
- Patent number 9,419,203
- Issue date Aug 16, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating a piezoresistive element in a piezoelectronic transistor
- Patent number 9,419,201
- Issue date Aug 16, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-limited crack etch to prevent device shorting
- Patent number 9,318,692
- Issue date Apr 19, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Passivation and alignment of piezoelectronic transistor piezoresistor
- Patent number 9,293,687
- Issue date Mar 22, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Piezoelectronic transistor with co-planar common and gate electrodes
- Patent number 9,287,489
- Issue date Mar 15, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating a piezoresistive element in a piezoelectronic transistor
- Patent number 9,263,664
- Issue date Feb 16, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanned probe microscopy (SPM) probe having angled tip
- Patent number 8,893,310
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Mark C. Reuter
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanned probe microscopy (SPM) probe having angled tip
- Patent number 8,539,611
- Issue date Sep 17, 2013
- International Business Machines Corporation
- Mark C. Reuter
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SELF-LIMITED CRACK ETCH TO PREVENT DEVICE SHORTING
- Publication number 20160248001
- Publication date Aug 25, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIEZOELECTRONIC TRANSISTOR WITH CO-PLANAR COMMON AND GATE ELECTRODES
- Publication number 20160126447
- Publication date May 5, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATING A PIEZORESISTIVE ELEMENT IN A PIEZOELECTRONIC TRANSISTOR
- Publication number 20160126448
- Publication date May 5, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSIVATION AND ALIGNMENT OF PIEZOELECTRONIC TRANSISTOR PIEZORESISTOR
- Publication number 20160126446
- Publication date May 5, 2016
- International Business Machines Corporation
- Brian A. Bryce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanned Probe Microscopy (SPM) Probe Having Angled Tip
- Publication number 20140007308
- Publication date Jan 2, 2014
- Cornell University
- Mark C. Reuter
- B82 - NANO-TECHNOLOGY

Brian A. Bryce

Person

Patents Grantslast 30 patents

Self-limited crack etch to prevent device shorting

Piezoelectronic transistor with co-planar common and gate electrodes

Passivation and alignment of piezoelectronic transistor piezoresistor

Integrating a piezoresistive element in a piezoelectronic transistor

Self-limited crack etch to prevent device shorting

Passivation and alignment of piezoelectronic transistor piezoresistor

Piezoelectronic transistor with co-planar common and gate electrodes

Integrating a piezoresistive element in a piezoelectronic transistor

Scanned probe microscopy (SPM) probe having angled tip

Scanned probe microscopy (SPM) probe having angled tip

Patents Applicationslast 30 patents

SELF-LIMITED CRACK ETCH TO PREVENT DEVICE SHORTING

PIEZOELECTRONIC TRANSISTOR WITH CO-PLANAR COMMON AND GATE ELECTRODES

INTEGRATING A PIEZORESISTIVE ELEMENT IN A PIEZOELECTRONIC TRANSISTOR

PASSIVATION AND ALIGNMENT OF PIEZOELECTRONIC TRANSISTOR PIEZORESISTOR

Scanned Probe Microscopy (SPM) Probe Having Angled Tip