Brian Brecht

Person

Newbury Park, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card pad geometry in automated test equipment
- Patent number 11,340,260
- Issue date May 24, 2022
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Grant
Transposed via arrangement in probe card for automated test equipment
- Patent number 11,333,683
- Issue date May 17, 2022
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Grant
Connecting circuit boards
- Patent number 11,272,616
- Issue date Mar 8, 2022
- Teradyne, Inc.
- Brian Brecht
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe card assembly in automated test equipment
- Patent number 11,215,641
- Issue date Jan 4, 2022
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial via arrangement in probe card for automated test equipment
- Patent number 11,162,980
- Issue date Nov 2, 2021
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Grant
Modularized device interface with grounding insert between two strips
- Patent number 7,541,819
- Issue date Jun 2, 2009
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Grant
High power interface
- Patent number 6,916,990
- Issue date Jul 12, 2005
- Teradyne, Inc.
- Arash Behziz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONNECTING CIRCUIT BOARDS
- Publication number 20220030718
- Publication date Jan 27, 2022
- Teradyne, Inc.
- Brian Brecht
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD PAD GEOMETRY IN AUTOMATED TEST EQUIPMENT
- Publication number 20210190826
- Publication date Jun 24, 2021
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD ASSEMBLY IN AUTOMATED TEST EQUIPMENT
- Publication number 20210190827
- Publication date Jun 24, 2021
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Application
TRANSPOSED VIA ARRANGEMENT IN PROBE CARD FOR AUTOMATED TEST EQUIPMENT
- Publication number 20210190828
- Publication date Jun 24, 2021
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL VIA ARRANGEMENT IN PROBE CARD FOR AUTOMATED TEST EQUIPMENT
- Publication number 20210190825
- Publication date Jun 24, 2021
- Teradyne, Inc.
- Brian Brecht
- G01 - MEASURING TESTING
Information Patent Application
MAINTAINING THE SHAPE OF A CIRCUIT BOARD
- Publication number 20200253041
- Publication date Aug 6, 2020
- Teradyne, Inc.
- Heng-Kit Too
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for automatic test equipment
- Publication number 20070096755
- Publication date May 3, 2007
- Teradyne, Inc.
- Frank B. Parrish
- G01 - MEASURING TESTING
Information Patent Application
High power interface
- Publication number 20040060725
- Publication date Apr 1, 2004
- Arash Behziz
- H01 - BASIC ELECTRIC ELEMENTS

Brian Brecht

Person

Patents Grantslast 30 patents

Probe card pad geometry in automated test equipment

Transposed via arrangement in probe card for automated test equipment

Connecting circuit boards

Probe card assembly in automated test equipment

Coaxial via arrangement in probe card for automated test equipment

Modularized device interface with grounding insert between two strips

High power interface

Patents Applicationslast 30 patents

CONNECTING CIRCUIT BOARDS

PROBE CARD PAD GEOMETRY IN AUTOMATED TEST EQUIPMENT

PROBE CARD ASSEMBLY IN AUTOMATED TEST EQUIPMENT

TRANSPOSED VIA ARRANGEMENT IN PROBE CARD FOR AUTOMATED TEST EQUIPMENT

COAXIAL VIA ARRANGEMENT IN PROBE CARD FOR AUTOMATED TEST EQUIPMENT

MAINTAINING THE SHAPE OF A CIRCUIT BOARD

Method and apparatus for automatic test equipment

High power interface