Brian Butka

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Alpharetta, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for source synchronous testing
- Patent number 7,548,105
- Issue date Jun 16, 2009
- Integrated Device Technology, Inc.
- Robert W. Shrank
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Impedance-matched output driver circuits having coarse and fine tun...
- Patent number 7,123,055
- Issue date Oct 17, 2006
- Integrated Device Technology, Inc.
- Yew-Keong Chong
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Impedance-matched output driver circuits having enhanced predriver...
- Patent number 7,053,661
- Issue date May 30, 2006
- Integrated Device Technology, Inc.
- Brian Butka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Delayed-locked loop with fine and coarse control using cascaded pha...
- Patent number 7,046,058
- Issue date May 16, 2006
- Integrated Device Technology, Ltd.
- Al Fang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Impedance-matched output driver circuits having enhanced predriver...
- Patent number 6,967,501
- Issue date Nov 22, 2005
- Integrated Device Technology, Inc.
- Brian Butka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Impedance-matched output driver circuits having linear characterist...
- Patent number 6,894,529
- Issue date May 17, 2005
- Integrated Device Technology, Inc.
- Yew-Keong Chong
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for source synchronous testing
- Publication number 20060294411
- Publication date Dec 28, 2006
- Integrated Device Technology, Inc.
- Robert W. Shrank
- G06 - COMPUTING CALCULATING COUNTING