Brian C. Lin

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Zhubei City, TW

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Patents Applicationslast 30 patents

Information Patent Application
Calibration Of Parametric Measurement Models Based On In-Line Wafer...
- Publication number 20240102941
- Publication date Mar 28, 2024
- KLA Corporation
- Brian C. Lin
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For Selecting Wafer Locations To Characterize C...
- Publication number 20230063102
- Publication date Mar 2, 2023
- KLA Corporation
- Brian C. Lin
- G01 - MEASURING TESTING