Brian D. Borchers

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Burnsville, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Flexible VLSI on-chip maintenance and test system with unit I/O cel...
- Patent number 4,912,709
- Issue date Mar 27, 1990
- Control Data Corporation
- Judy L. Teske
- G01 - MEASURING TESTING
Information Patent Grant
Clock monitor for use with VLSI chips
- Patent number 4,860,288
- Issue date Aug 22, 1989
- Control Data Corporation
- Judy L. Teske
- G01 - MEASURING TESTING