Brian Duffy

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Context-based defect inspection
- Patent number 11,922,619
- Issue date Mar 5, 2024
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mode selection and defect detection training
- Patent number 11,769,242
- Issue date Sep 26, 2023
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-controller inspection system
- Patent number 11,415,526
- Issue date Aug 16, 2022
- KLA Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
And noise based care areas
- Patent number 10,832,396
- Issue date Nov 10, 2020
- KLA-Tencor Corp.
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating high resolution images from low resolution images for se...
- Patent number 10,769,761
- Issue date Sep 8, 2020
- KLA-Tencor Corp.
- Saurabh Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Active learning for defect classifier training
- Patent number 10,713,769
- Issue date Jul 14, 2020
- KLA-Tencor Corp.
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Identifying nuisances and defects of interest in defects detected o...
- Patent number 10,699,926
- Issue date Jun 30, 2020
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated pattern fidelity measurement plan generation
- Patent number 10,670,535
- Issue date Jun 2, 2020
- KLA-Tencor Corp.
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid inspection system for efficient process window discovery
- Patent number 10,551,827
- Issue date Feb 4, 2020
- KLA-Tencor Corporation
- Brian Duffy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Voltage contrast based fault and defect inference in logic chips
- Patent number 10,539,612
- Issue date Jan 21, 2020
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Metrology recipe generation using predicted metrology images
- Patent number 10,496,781
- Issue date Dec 3, 2019
- KLA-Tencor Corporation
- Chao Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Virtual inspection systems with multiple modes
- Patent number 10,416,088
- Issue date Sep 17, 2019
- KLA-Tencor Corp.
- Brian Duffy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual inspection systems for process window characterization
- Patent number 10,402,461
- Issue date Sep 3, 2019
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining one or more characteristics of a pattern of interest on...
- Patent number 10,359,371
- Issue date Jul 23, 2019
- KLA-Tencor Corp.
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Particle beam inspector with independently-controllable beams
- Patent number 10,276,346
- Issue date Apr 30, 2019
- KLA-Tencor Corporation
- Brian Duffy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated pattern fidelity measurement plan generation
- Patent number 10,267,746
- Issue date Apr 23, 2019
- KLA-Tencor Corp.
- Brian Duffy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determining coordinates for an area of interest on a specimen
- Patent number 10,127,653
- Issue date Nov 13, 2018
- KLA-Tencor Corp.
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid inspectors
- Patent number 9,916,965
- Issue date Mar 13, 2018
- KLA-Tencor Corp.
- Kris Bhaskar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Virtual inspection systems with multiple modes
- Patent number 9,816,939
- Issue date Nov 14, 2017
- KLA-Tencor Corp.
- Brian Duffy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selecting one or more parameters for inspection of a wafer
- Patent number 9,601,393
- Issue date Mar 21, 2017
- KLA-Tencor Corp.
- Chris Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection recipe setup from reference image variation
- Patent number 9,262,821
- Issue date Feb 16, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generalized virtual inspector
- Patent number 9,222,895
- Issue date Dec 29, 2015
- KLA-Tencor Corp.
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Grant
Detecting defects on a wafer with run time use of design data
- Patent number 9,183,624
- Issue date Nov 10, 2015
- KLA-Tencor Corp.
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device property extraction, generation, visualization...
- Patent number 8,611,639
- Issue date Dec 17, 2013
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring of time-varying defect classification performance
- Patent number 8,537,349
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Patrick Huet
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and systems for using electrical information for a device b...
- Patent number 8,194,968
- Issue date Jun 5, 2012
- KLA-Tencor Corp.
- Allen Park
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for utilizing design data in combination with i...
- Patent number 8,139,843
- Issue date Mar 20, 2012
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for determining a position of inspection data i...
- Patent number 8,041,103
- Issue date Oct 18, 2011
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROTECTING DATA SOURCES FROM DIFFERENT ENTITIES FOR SEMICONDUCTOR Y...
- Publication number 20240169116
- Publication date May 23, 2024
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTEXT-BASED DEFECT INSPECTION
- Publication number 20230316500
- Publication date Oct 5, 2023
- KLA Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODE SELECTION AND DEFECT DETECTION TRAINING
- Publication number 20210366103
- Publication date Nov 25, 2021
- KLA Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-CONTROLLER INSPECTION SYSTEM
- Publication number 20210349038
- Publication date Nov 11, 2021
- KLA Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
DESIGN AND NOISE BASED CARE AREAS
- Publication number 20200126212
- Publication date Apr 23, 2020
- KLA-Tencor Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING
- Publication number 20190370955
- Publication date Dec 5, 2019
- KLA-Tencor Corporation
- Jing Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Pattern Fidelity Measurement Plan Generation
- Publication number 20190204237
- Publication date Jul 4, 2019
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Identifying Nuisances and Defects of Interest in Defects Detected o...
- Publication number 20190067060
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hybrid Inspection System for Efficient Process Window Discovery
- Publication number 20190033838
- Publication date Jan 31, 2019
- KLA-Tencor Corporation
- Brian Duffy
- G05 - CONTROLLING REGULATING
Information Patent Application
GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...
- Publication number 20190005629
- Publication date Jan 3, 2019
- KLA-Tencor Corporation
- Saurabh Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Recipe Generation Using Predicted Metrology Images
- Publication number 20180173839
- Publication date Jun 21, 2018
- KLA-Tencor Corporation
- Chao Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VIRTUAL INSPECTION SYSTEMS WITH MULTIPLE MODES
- Publication number 20180052118
- Publication date Feb 22, 2018
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTORS
- Publication number 20170194126
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...
- Publication number 20170193400
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Determining One or More Characteristics of a Pattern of Interest on...
- Publication number 20170059491
- Publication date Mar 2, 2017
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Voltage Contrast Based Fault and Defect Inference in Logic Chips
- Publication number 20160341791
- Publication date Nov 24, 2016
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Virtual Inspection Systems for Process Window Characterization
- Publication number 20160150191
- Publication date May 26, 2016
- KLA-Tencor Corporation
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automated Pattern Fidelity Measurement Plan Generation
- Publication number 20160116420
- Publication date Apr 28, 2016
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING COORDINATES FOR AN AREA OF INTEREST ON A SPECIMEN
- Publication number 20160027164
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Brian Duffy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Virtual Inspection Systems with Multiple Modes
- Publication number 20160025648
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Inspection Recipe Setup from Reference Image Variation
- Publication number 20150324964
- Publication date Nov 12, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer with Run Time Use of Design Data
- Publication number 20140376801
- Publication date Dec 25, 2014
- Laurent Karsenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generalized Virtual Inspector
- Publication number 20140241610
- Publication date Aug 28, 2014
- KLA-Tencor Corporation
- Brian Duffy
- G01 - MEASURING TESTING
Information Patent Application
Selecting One or More Parameters for Inspection of a Wafer
- Publication number 20110320149
- Publication date Dec 29, 2011
- KLA-Tencor Corporation
- Chris Lee
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20110286656
- Publication date Nov 24, 2011
- KLA-Tencor Technologies Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE
- Publication number 20110224932
- Publication date Sep 15, 2011
- KLA-Tencor Corporation
- Patrick Huet
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON A RETICLE
- Publication number 20100142800
- Publication date Jun 10, 2010
- KLA-Tencor Corporation
- Patrick Tung-Sing Pak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...
- Publication number 20100119144
- Publication date May 13, 2010
- KLA-Tencor Technologies Corporation
- Ashok Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...
- Publication number 20090080759
- Publication date Mar 26, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...
- Publication number 20090037134
- Publication date Feb 5, 2009
- Ashok Kulkarni
- G01 - MEASURING TESTING

Brian Duffy

Person

Patents Grantslast 30 patents

Context-based defect inspection

Mode selection and defect detection training

Accelerated training of a machine learning based model for semicond...

Multi-controller inspection system

And noise based care areas

Generating high resolution images from low resolution images for se...

Active learning for defect classifier training

Identifying nuisances and defects of interest in defects detected o...

Automated pattern fidelity measurement plan generation

Hybrid inspection system for efficient process window discovery

Voltage contrast based fault and defect inference in logic chips

Metrology recipe generation using predicted metrology images

Virtual inspection systems with multiple modes

Virtual inspection systems for process window characterization

Determining one or more characteristics of a pattern of interest on...

Particle beam inspector with independently-controllable beams

Automated pattern fidelity measurement plan generation

Determining coordinates for an area of interest on a specimen

Hybrid inspectors

Virtual inspection systems with multiple modes

Selecting one or more parameters for inspection of a wafer

Inspection recipe setup from reference image variation

Generalized virtual inspector

Detecting defects on a wafer with run time use of design data

Semiconductor device property extraction, generation, visualization...

Monitoring of time-varying defect classification performance

Methods and systems for using electrical information for a device b...

Methods and systems for utilizing design data in combination with i...

Systems and methods for creating persistent data for a wafer and fo...

Methods and systems for determining a position of inspection data i...

Patents Applicationslast 30 patents

PROTECTING DATA SOURCES FROM DIFFERENT ENTITIES FOR SEMICONDUCTOR Y...

CONTEXT-BASED DEFECT INSPECTION

MODE SELECTION AND DEFECT DETECTION TRAINING

MULTI-CONTROLLER INSPECTION SYSTEM

DESIGN AND NOISE BASED CARE AREAS

ACTIVE LEARNING FOR DEFECT CLASSIFIER TRAINING

Automated Pattern Fidelity Measurement Plan Generation

Identifying Nuisances and Defects of Interest in Defects Detected o...

Hybrid Inspection System for Efficient Process Window Discovery

GENERATING HIGH RESOLUTION IMAGES FROM LOW RESOLUTION IMAGES FOR SE...

Metrology Recipe Generation Using Predicted Metrology Images

VIRTUAL INSPECTION SYSTEMS WITH MULTIPLE MODES

HYBRID INSPECTORS

ACCELERATED TRAINING OF A MACHINE LEARNING BASED MODEL FOR SEMICOND...

Determining One or More Characteristics of a Pattern of Interest on...

Voltage Contrast Based Fault and Defect Inference in Logic Chips

Virtual Inspection Systems for Process Window Characterization

Automated Pattern Fidelity Measurement Plan Generation

DETERMINING COORDINATES FOR AN AREA OF INTEREST ON A SPECIMEN

Virtual Inspection Systems with Multiple Modes

Inspection Recipe Setup from Reference Image Variation

Detecting Defects on a Wafer with Run Time Use of Design Data

Generalized Virtual Inspector

Selecting One or More Parameters for Inspection of a Wafer

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

MONITORING OF TIME-VARYING DEFECT CLASSIFICATION PERFORMANCE

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON A RETICLE

METHODS AND SYSTEMS FOR UTILIZING DESIGN DATA IN COMBINATION WITH I...

SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...

SEMICONDUCTOR DEVICE PROPERTY EXTRACTION, GENERATION, VISUALIZATION...