Brian F. Keish

Follow

Person

Stanford, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of applying boundary test patterns
- Patent number 5,606,565
- Issue date Feb 25, 1997
- Hughes Electronics
- Christopher L. Edler
- G01 - MEASURING TESTING
Information Patent Grant
Boundary test cell with self masking capability
- Patent number 5,528,610
- Issue date Jun 18, 1996
- Hughes Aircraft Company
- Christopher L. Edler
- G01 - MEASURING TESTING