Brian G. Saar

Follow

Person

Cambridge, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Material property determination using photothermal speckle detection
- Patent number 10,605,662
- Issue date Mar 31, 2020
- Massachusetts Institute of Technology
- Thomas H. Jeys
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for sensing targets using photothermal speckle...
- Patent number 10,228,284
- Issue date Mar 12, 2019
- Massachusetts Institute of Technology
- Thomas H. Jeys
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods providing efficient detection of back-scattered...
- Patent number 8,681,331
- Issue date Mar 25, 2014
- President and Fellows of Harvard College
- Sunney Xiaoliang Xie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Material Property Determination Using Photothermal Speckle Detection
- Publication number 20190250038
- Publication date Aug 15, 2019
- Massachusetts Institute of Technology
- Thomas H. Jeys
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR SENSING TARGETS USING PHOTOTHERMAL SPECKLE...
- Publication number 20170211977
- Publication date Jul 27, 2017
- Massachusetts Institute of Technology
- Thomas H. Jeys
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS PROVIDING EFFICIENT DETECTION OF BACK-SCATTERED...
- Publication number 20130162994
- Publication date Jun 27, 2013
- President and Fellows of Harvard College
- Sunney Xiaoliang Xie
- G01 - MEASURING TESTING