Brian Halvorson

Person

St. Paul, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,928,423
- Issue date Feb 23, 2021
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit probe array and method of construction
- Patent number 10,330,702
- Issue date Jun 25, 2019
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit probe array and method of construction
- Patent number 10,078,101
- Issue date Sep 18, 2018
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,067,164
- Issue date Sep 4, 2018
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit contactor and method of construction
- Patent number 9,817,026
- Issue date Nov 14, 2017
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit and wafer level IC te...
- Patent number 9,696,347
- Issue date Jul 4, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level integrated circuit contactor and method of construction
- Patent number 9,261,537
- Issue date Feb 16, 2016
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wafer Level Integrated Circuit Probe Array and Method of Construction
- Publication number 20190041429
- Publication date Feb 7, 2019
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20190004093
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Probe Array and Method of Construction
- Publication number 20170074926
- Publication date Mar 16, 2017
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20170059616
- Publication date Mar 2, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Contactor and Method of Construction
- Publication number 20160161528
- Publication date Jun 9, 2016
- Johnstech International Corporation
- Jathan Edwards
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...
- Publication number 20150015287
- Publication date Jan 15, 2015
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Wafer Level Integrated Circuit Contactor and Method of Construction
- Publication number 20130342233
- Publication date Dec 26, 2013
- Jathan Edwards
- G01 - MEASURING TESTING

Brian Halvorson

Person

Patents Grantslast 30 patents

Testing apparatus and method for microcircuit testing with conical...

Wafer level integrated circuit probe array and method of construction

Wafer level integrated circuit probe array and method of construction

Testing apparatus and method for microcircuit testing with conical...

Wafer level integrated circuit contactor and method of construction

Testing apparatus and method for microcircuit and wafer level IC te...

Wafer level integrated circuit contactor and method of construction

Patents Applicationslast 30 patents

Wafer Level Integrated Circuit Probe Array and Method of Construction

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Wafer Level Integrated Circuit Probe Array and Method of Construction

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Wafer Level Integrated Circuit Contactor and Method of Construction

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...

Wafer Level Integrated Circuit Contactor and Method of Construction