Brian J. Arkin

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer level contactor
- Patent number 8,400,176
- Issue date Mar 19, 2013
- FormFactor, Inc.
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for enhanced probe card architecture
- Patent number 7,893,701
- Issue date Feb 22, 2011
- FormFactor, Inc.
- Brian Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester with software-scaleable channels
- Patent number 7,243,278
- Issue date Jul 10, 2007
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
High-speed algorithmic pattern generator
- Patent number 6,836,868
- Issue date Dec 28, 2004
- Credence Systems Corporation
- Brian J. Arkin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit tester having a program status memory
- Patent number 6,380,730
- Issue date Apr 30, 2002
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing memories with redundant storage elements
- Patent number 6,256,757
- Issue date Jul 3, 2001
- Credence Systems Corporation
- Brian J. Arkin
- G11 - INFORMATION STORAGE
Information Patent Grant
Parallel processing pattern generation system for an integrated cir...
- Patent number 6,073,263
- Issue date Jun 6, 2000
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Format sensitive timing calibration for an integrated circuit tester
- Patent number 6,060,898
- Issue date May 9, 2000
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Modular integrated circuit tester with distributed synchronization...
- Patent number 6,028,439
- Issue date Feb 22, 2000
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester having pattern generator controlled data bus
- Patent number 5,951,705
- Issue date Sep 14, 1999
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Grant
Programmable formatter circuit for integrated circuit tester
- Patent number 5,919,270
- Issue date Jul 6, 1999
- Credence Systems Corporation
- Brian J. Arkin
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit tester having multiple period generators
- Patent number 5,917,834
- Issue date Jun 29, 1999
- Credence Systems Corporation
- Brian J. Arkin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER LEVEL CONTACTOR
- Publication number 20110043233
- Publication date Feb 24, 2011
- FormFactor, Inc.
- Brian Arkin
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ENHANCED PROBE CARD ARCHITECTURE
- Publication number 20090273358
- Publication date Nov 5, 2009
- FormFactor, Inc.
- Brian Arkin
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit tester with software-scaleable channels
- Publication number 20070061640
- Publication date Mar 15, 2007
- Brian J. Arkin
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing bio-semiconductor integrated circuits
- Publication number 20060267570
- Publication date Nov 30, 2006
- Brian J. Arkin
- G01 - MEASURING TESTING

Brian J. Arkin

Person

Patents Grantslast 30 patents

Wafer level contactor

Method and apparatus for enhanced probe card architecture

Integrated circuit tester with software-scaleable channels

High-speed algorithmic pattern generator

Integrated circuit tester having a program status memory

Apparatus for testing memories with redundant storage elements

Parallel processing pattern generation system for an integrated cir...

Format sensitive timing calibration for an integrated circuit tester

Modular integrated circuit tester with distributed synchronization...

Integrated circuit tester having pattern generator controlled data bus

Programmable formatter circuit for integrated circuit tester

Integrated circuit tester having multiple period generators

Patents Applicationslast 30 patents

WAFER LEVEL CONTACTOR

METHOD AND APPARATUS FOR ENHANCED PROBE CARD ARCHITECTURE

Integrated circuit tester with software-scaleable channels

Apparatus and method for testing bio-semiconductor integrated circuits