Brian J. Wojszynski

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Hyde Park, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Ionization test for electrical verification
- Patent number 7,808,257
- Issue date Oct 5, 2010
- International Business Machines Corporation
- Christopher W. Cline
- G01 - MEASURING TESTING
Information Patent Grant
Interconnect package cluster probe short removal apparatus and method
- Patent number 6,753,688
- Issue date Jun 22, 2004
- International Business Machines Corporation
- Roger M. Eddy
- G01 - MEASURING TESTING
Information Patent Grant
Substrate tester method and apparatus having rotatable and infinite...
- Patent number 6,005,386
- Issue date Dec 21, 1999
- International Business Machines Corporation
- Robert H. Cadwallader
- G01 - MEASURING TESTING
Information Patent Grant
Substrate tester having shorting pad actuator method and apparatus
- Patent number 5,917,329
- Issue date Jun 29, 1999
- International Business Machines Corporation
- Robert H. Cadwallader
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Ionization test for electrical verification
- Publication number 20070108984
- Publication date May 17, 2007
- International Business Machines Corporation
- Christopher W. Cline
- G01 - MEASURING TESTING
Information Patent Application
Interconnect package cluster probe short removal apparatus and method
- Publication number 20020145434
- Publication date Oct 10, 2002
- International Business Machines Corporation
- Roger M. Eddy
- G01 - MEASURING TESTING