Brian Joseph Williams

Person

Tigard, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Spatially tunable deposition to compensate within wafer differentia...
- Patent number 11,946,142
- Issue date Apr 2, 2024
- Lam Research Corporation
- Fayaz A. Shaikh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Carrier ring designs for controlling deposition on wafer bevel/edge
- Patent number 11,837,495
- Issue date Dec 5, 2023
- Lam Research Corporation
- Michael J. Janicki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carrier ring designs for controlling deposition on wafer bevel/edge
- Patent number 11,830,759
- Issue date Nov 28, 2023
- Lam Research Corporation
- Michael J. Janicki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE ANALYSIS OF PLASMA CONDITIONS
- Publication number 20240234112
- Publication date Jul 11, 2024
- LAM RESEARCH CORPORATION
- Michal Danek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPATIALLY TUNABLE DEPOSITION TO COMPENSATE WITHIN WAFER DIFFERENTIA...
- Publication number 20240167161
- Publication date May 23, 2024
- LAM RESEARCH CORPORATION
- Fayaz A. Shaikh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CARRIER RING DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE
- Publication number 20240055293
- Publication date Feb 15, 2024
- LAM RESEARCH CORPORATION
- Michael John Janicki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREDICTIVE MAINTENANCE FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20230400847
- Publication date Dec 14, 2023
- LAM RESEARCH CORPORATION
- Jian Guo
- G05 - CONTROLLING REGULATING
Information Patent Application
SHOWERHEAD DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE
- Publication number 20230167552
- Publication date Jun 1, 2023
- LAM RESEARCH CORPORATION
- Michael J. JANICKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PURGING SPINDLE ARMS TO PREVENT DEPOSITION AND WAFER SLIDING
- Publication number 20230005776
- Publication date Jan 5, 2023
- LAM RESEARCH CORPORATION
- Prasanna KULKARNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPATIALLY TUNABLE DEPOSITION TO COMPENSATE WITHIN WAFER DIFFERENTIA...
- Publication number 20220298632
- Publication date Sep 22, 2022
- LAM RESEARCH CORPORATION
- Fayaz A. Shaikh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INDEPENDENTLY ADJUSTABLE FLOWPATH CONDUCTANCE IN MULTI-STATION SEMI...
- Publication number 20220228263
- Publication date Jul 21, 2022
- LAM RESEARCH CORPORATION
- Michael Philip Roberts
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CARRIER RING DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE
- Publication number 20220115261
- Publication date Apr 14, 2022
- LAM RESEARCH CORPORATION
- Michael J. Janicki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CARRIER RING DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE
- Publication number 20220108912
- Publication date Apr 7, 2022
- LAM RESEARCH CORPORATION
- Michael J. Janicki
- H01 - BASIC ELECTRIC ELEMENTS

Brian Joseph Williams

Person

Patents Grantslast 30 patents

Spatially tunable deposition to compensate within wafer differentia...

Carrier ring designs for controlling deposition on wafer bevel/edge

Carrier ring designs for controlling deposition on wafer bevel/edge

Patents Applicationslast 30 patents

IMAGE ANALYSIS OF PLASMA CONDITIONS

SPATIALLY TUNABLE DEPOSITION TO COMPENSATE WITHIN WAFER DIFFERENTIA...

CARRIER RING DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE

PREDICTIVE MAINTENANCE FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT

SHOWERHEAD DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE

PURGING SPINDLE ARMS TO PREVENT DEPOSITION AND WAFER SLIDING

SPATIALLY TUNABLE DEPOSITION TO COMPENSATE WITHIN WAFER DIFFERENTIA...

INDEPENDENTLY ADJUSTABLE FLOWPATH CONDUCTANCE IN MULTI-STATION SEMI...

CARRIER RING DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE

CARRIER RING DESIGNS FOR CONTROLLING DEPOSITION ON WAFER BEVEL/EDGE