Brian K. Cusson

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Initiating test runs based on fault detection results
- Patent number 7,581,140
- Issue date Aug 25, 2009
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determining the health of a desired node in a multi-level system
- Patent number 7,246,290
- Issue date Jul 17, 2007
- Advanced Micro Devices, Inc.
- Eric O. Green
- G05 - CONTROLLING REGULATING
Information Patent Grant
Determining transmission of error effects for improving parametric...
- Patent number 7,117,062
- Issue date Oct 3, 2006
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- G01 - MEASURING TESTING
Information Patent Grant
Conflict resolution among multiple controllers
- Patent number 7,031,793
- Issue date Apr 18, 2006
- Advanced Micro Devices, Inc.
- Naomi M. Jenkins
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fault detection spanning multiple processes
- Patent number 6,991,945
- Issue date Jan 31, 2006
- Advanced Micro Devices, Inc.
- Howard E. Castle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for adaptive sampling based on process covariance
- Patent number 6,985,825
- Issue date Jan 10, 2006
- Advanced Micro Devices, Inc.
- Richard P. Good
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Advanced process control of the manufacture of an oxide-nitride-oxi...
- Patent number 6,953,697
- Issue date Oct 11, 2005
- Advanced Micro Devices, Inc.
- Howard E. Castle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process control based on an estimated process result
- Patent number 6,925,347
- Issue date Aug 2, 2005
- Advanced Micro Devices, Inc.
- Michael L. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Adjusting a trace data rate based upon a tool state
- Patent number 6,834,211
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of controlling wafer charging effects due to manufacturing p...
- Patent number 6,800,562
- Issue date Oct 5, 2004
- Advanced Micro Devices, Inc.
- Brian K. Cusson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying a cause of a fault based on a process controller output
- Patent number 6,778,873
- Issue date Aug 17, 2004
- Advanced Micro Devices, Inc.
- Jin Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Adjusting a sampling rate based on state estimation results
- Patent number 6,766,214
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Jin Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determination of a process flow based upon fault detection analysis
- Patent number 6,740,534
- Issue date May 25, 2004
- Advanced Micro Devices, Inc.
- Ernest D. Adams
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Wafer fabrication system providing measurement data screening
- Patent number 6,446,022
- Issue date Sep 3, 2002
- Advanced Micro Devices, Inc.
- Elfido Coss
- G05 - CONTROLLING REGULATING
Information Patent Grant
Statistical process control system with normalized control charting
- Patent number 6,424,876
- Issue date Jul 23, 2002
- Advanced Micro Devices, Inc.
- Brian K. Cusson
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for performing metrology dispatching based upo...
- Publication number 20050021272
- Publication date Jan 27, 2005
- Naomi M. Jenkins
- H01 - BASIC ELECTRIC ELEMENTS

Brian K. Cusson

Person

Patents Grantslast 30 patents

Initiating test runs based on fault detection results

Determining the health of a desired node in a multi-level system

Determining transmission of error effects for improving parametric...

Conflict resolution among multiple controllers

Fault detection spanning multiple processes

Method and apparatus for adaptive sampling based on process covariance

Advanced process control of the manufacture of an oxide-nitride-oxi...

Process control based on an estimated process result

Adjusting a trace data rate based upon a tool state

Method of controlling wafer charging effects due to manufacturing p...

Identifying a cause of a fault based on a process controller output

Adjusting a sampling rate based on state estimation results

Determination of a process flow based upon fault detection analysis

Wafer fabrication system providing measurement data screening

Statistical process control system with normalized control charting

Patents Applicationslast 30 patents

Method and apparatus for performing metrology dispatching based upo...