Brian K. Kirkpatrick

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Cleaning method with in-line SPM processing
- Patent number 12,051,599
- Issue date Jul 30, 2024
- Applied Materials, Inc.
- Brian J. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface cleaning with directed high pressure chemistry
- Patent number 12,027,382
- Issue date Jul 2, 2024
- Applied Materials, Inc.
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced semiconductor wafer bow and warpage
- Patent number 11,942,359
- Issue date Mar 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleaning system with in-line SPM processing
- Patent number 11,682,567
- Issue date Jun 20, 2023
- Applied Materials, Inc.
- Brian J. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Split gate memory cell fabrication and system
- Patent number 11,239,346
- Issue date Feb 1, 2022
- Texas Instruments Incorporated
- John Howard MacPeak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for stripping one or more layers from a semiconductor wafer
- Patent number 11,205,575
- Issue date Dec 21, 2021
- Texas Instruments Incorporated
- Byron Joseph Palla
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dopant anneal with stabilization step for IC with matched devices
- Patent number 11,205,578
- Issue date Dec 21, 2021
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having chemically modified spacer surface
- Patent number 10,483,261
- Issue date Nov 19, 2019
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductors
- Patent number 9,881,795
- Issue date Jan 30, 2018
- Texas Instruments Incorporated
- David Gerald Farber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner L-spacer for replacement gate flow
- Patent number 9,768,078
- Issue date Sep 19, 2017
- Texas Instruments Incorporated
- Chet Vernon Lenox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-k / metal gate CMOS transistors with TiN gates
- Patent number 9,721,847
- Issue date Aug 1, 2017
- Texas Instruments Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having chemically modified spacer surface
- Patent number 9,620,423
- Issue date Apr 11, 2017
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having chemically modified spacer surface
- Patent number 9,496,359
- Issue date Nov 15, 2016
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductors
- Patent number 9,490,143
- Issue date Nov 8, 2016
- Texas Instruments Incorporated
- David Gerald Farber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner L-spacer for replacement gate flow
- Patent number 9,362,375
- Issue date Jun 7, 2016
- Texas Instruments Incorporated
- Chet Vernon Lenox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hard mask for source/drain epitaxy control
- Patent number 9,224,657
- Issue date Dec 29, 2015
- Texas Instruments Incorporated
- David Gerald Farber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner L-spacer for replacement gate flow
- Patent number 9,178,037
- Issue date Nov 3, 2015
- Texas Instruments Incorporated
- Chet Vernon Lenox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner L-spacer for replacement gate flow
- Patent number 9,087,917
- Issue date Jul 21, 2015
- Texas Instruments Incorporated
- Chet Vernon Lenox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-k / metal gate CMOS transistors with TiN gates
- Patent number 9,070,785
- Issue date Jun 30, 2015
- Texas Instruments Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including SiON gate dielectric with portions h...
- Patent number 8,748,996
- Issue date Jun 10, 2014
- Texas Instruments Incorporated
- James Joseph Chambers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS transistors including SiON gate dielectric with enhanced nitrog...
- Patent number 8,748,992
- Issue date Jun 10, 2014
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Die having coefficient of thermal expansion graded layer
- Patent number 8,618,661
- Issue date Dec 31, 2013
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming MOS transistors including SiON gate dielectric wi...
- Patent number 8,450,221
- Issue date May 28, 2013
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including SiON gate dielectric with portions h...
- Patent number 8,441,078
- Issue date May 14, 2013
- Texas Instruments Incorporated
- James Joseph Chambers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate dielectric first replacement gate processes and integrated cir...
- Patent number 8,372,703
- Issue date Feb 12, 2013
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curvature reduction for semiconductor wafers
- Patent number 8,252,609
- Issue date Aug 28, 2012
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer planarity control between pattern levels
- Patent number 8,216,945
- Issue date Jul 10, 2012
- Texas Instruments Incorporated
- Steven L. Prins
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Recessed STI for wide transistors
- Patent number 8,058,161
- Issue date Nov 15, 2011
- Texas Instruments Incorporated
- Gabriel George Barna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nitride removal while protecting semiconductor surfaces for forming...
- Patent number 8,043,921
- Issue date Oct 25, 2011
- Texas Instruments Incorporated
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for removing wafer edge residue and debris usin...
- Patent number 7,998,865
- Issue date Aug 16, 2011
- Texas Instruments Incorporated
- Joe G. Tran
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEDICATED SULFURIC-PEROXIDE PROCESS MODULE FOR POST-CMP CLEANING PL...
- Publication number 20240412985
- Publication date Dec 12, 2024
- Applied Materials, Inc.
- Clinton SAKATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND PROCESS FOR POST-CHEMICAL MECHANICAL POLISHING CLEANING
- Publication number 20240226967
- Publication date Jul 11, 2024
- Applied Materials, Inc.
- Clinton SAKATA
- B08 - CLEANING
Information Patent Application
REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE
- Publication number 20240194519
- Publication date Jun 13, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLEANING METHOD WITH IN-LINE SPM PROCESSING
- Publication number 20230290652
- Publication date Sep 14, 2023
- Applied Materials, Inc.
- Brian J. Brown
- B08 - CLEANING
Information Patent Application
SURFACE CLEANING WITH DIRECTED HIGH PRESSURE CHEMISTRY
- Publication number 20230178388
- Publication date Jun 8, 2023
- Applied Materials, Inc.
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE
- Publication number 20230170248
- Publication date Jun 1, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Abbas Ali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATEAD WET CLEAN FOR BEVEL TREATMENTS
- Publication number 20230021398
- Publication date Jan 26, 2023
- Applied Materials, Inc.
- Brian K. Kirkpatrick
- B08 - CLEANING
Information Patent Application
INTEGRATED WET CLEAN FOR GATE STACK DEVELOPMENT
- Publication number 20230010499
- Publication date Jan 12, 2023
- Applied Materials, Inc.
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED WET CLEAN FOR EPITAXIAL GROWTH
- Publication number 20230008695
- Publication date Jan 12, 2023
- Applied Materials, Inc.
- Brian K. Kirkpatrick
- B08 - CLEANING
Information Patent Application
CLEANING SYSTEM WITH IN-LINE SPM PROCESSING
- Publication number 20210407825
- Publication date Dec 30, 2021
- Applied Materials, Inc.
- Brian J. Brown
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SPLIT GATE MEMORY CELL FABRICATION AND SYSTEM
- Publication number 20200381541
- Publication date Dec 3, 2020
- TEXAS INSTRUMENTS INCORPORATED
- John Howard MacPeak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DOPANT ANNEAL WITH STABILIZATION STEP FOR IC WITH MATCHED DEVICES
- Publication number 20190115226
- Publication date Apr 18, 2019
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE
- Publication number 20170179126
- Publication date Jun 22, 2017
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING SEMICONDUCTORS
- Publication number 20170148634
- Publication date May 25, 2017
- TEXAS INSTRUMENTS INCORPORATED
- David Gerald Farber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNER L-SPACER FOR REPLACEMENT GATE FLOW
- Publication number 20160254197
- Publication date Sep 1, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Chet Vernon LENOX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE
- Publication number 20160233132
- Publication date Aug 11, 2016
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE SLOT OVERETCH CONTROL
- Publication number 20160118269
- Publication date Apr 28, 2016
- TEXAS INSTRUMENTS INCORPORATED
- EBENEZER ESHUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE
- Publication number 20160027884
- Publication date Jan 28, 2016
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNER L-SPACER FOR REPLACEMENT GATE FLOW
- Publication number 20150311304
- Publication date Oct 29, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Chet Vernon LENOX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-K / METAL GATE CMOS TRANSISTORS WITH TiN GATES
- Publication number 20150287643
- Publication date Oct 8, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNER L-SPACER FOR REPLACEMENT GATE FLOW
- Publication number 20150279966
- Publication date Oct 1, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Chet Vernon LENOX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-K / METAL GATE CMOS TRANSISTORS WITH TiN GATES
- Publication number 20150187653
- Publication date Jul 2, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNER L-SPACER FOR REPLACEMENT GATE FLOW
- Publication number 20150069516
- Publication date Mar 12, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Chet Vernon LENOX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HARD MASK FOR SOURCE/DRAIN EPITAXY CONTROL
- Publication number 20150044830
- Publication date Feb 12, 2015
- TEXAS INSTRUMENTS INCORPORATED
- David Gerald Farber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATING A SEMICONDUCTOR DIE HAVING COEFFICIENT OF THERMAL EXPAN...
- Publication number 20140080301
- Publication date Mar 20, 2014
- Brian K. Kirkpatrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE
- Publication number 20130248949
- Publication date Sep 26, 2013
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING SION GATE DIELECTRIC WITH PORTIONS H...
- Publication number 20130228879
- Publication date Sep 5, 2013
- TEXAS INSTRUMENTS INCORPORATED
- James Joseph CHAMBERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS TRANSISTORS INCLUDING SiON GATE DIELECTRIC WITH ENHANCED NITROG...
- Publication number 20130221451
- Publication date Aug 29, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Brian K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIE HAVING COEFFICIENT OF THERMAL EXPANSION GRADED LAYER
- Publication number 20130082385
- Publication date Apr 4, 2013
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOS TRANSISTORS INCLUDING SiON GATE DIELECTRIC WITH ENHANCED NITROG...
- Publication number 20120032280
- Publication date Feb 9, 2012
- TEXAS INSTRUMENTS INCORPORATED
- BRIAN K. KIRKPATRICK
- H01 - BASIC ELECTRIC ELEMENTS

Brian K. Kirkpatrick

Person

Patents Grantslast 30 patents

Cleaning method with in-line SPM processing

Surface cleaning with directed high pressure chemistry

Reduced semiconductor wafer bow and warpage

Cleaning system with in-line SPM processing

Split gate memory cell fabrication and system

Method for stripping one or more layers from a semiconductor wafer

Dopant anneal with stabilization step for IC with matched devices

Integrated circuit having chemically modified spacer surface

Method of fabricating semiconductors

Inner L-spacer for replacement gate flow

High-k / metal gate CMOS transistors with TiN gates

Integrated circuit having chemically modified spacer surface

Integrated circuit having chemically modified spacer surface

Method of fabricating semiconductors

Inner L-spacer for replacement gate flow

Hard mask for source/drain epitaxy control

Inner L-spacer for replacement gate flow

Inner L-spacer for replacement gate flow

High-k / metal gate CMOS transistors with TiN gates

Semiconductor device including SiON gate dielectric with portions h...

MOS transistors including SiON gate dielectric with enhanced nitrog...

Die having coefficient of thermal expansion graded layer

Method of forming MOS transistors including SiON gate dielectric wi...

Semiconductor device including SiON gate dielectric with portions h...

Gate dielectric first replacement gate processes and integrated cir...

Curvature reduction for semiconductor wafers

Wafer planarity control between pattern levels

Recessed STI for wide transistors

Nitride removal while protecting semiconductor surfaces for forming...

Systems and methods for removing wafer edge residue and debris usin...

Patents Applicationslast 30 patents

DEDICATED SULFURIC-PEROXIDE PROCESS MODULE FOR POST-CMP CLEANING PL...

SYSTEM AND PROCESS FOR POST-CHEMICAL MECHANICAL POLISHING CLEANING

REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE

CLEANING METHOD WITH IN-LINE SPM PROCESSING

SURFACE CLEANING WITH DIRECTED HIGH PRESSURE CHEMISTRY

REDUCED SEMICONDUCTOR WAFER BOW AND WARPAGE

INTEGRATEAD WET CLEAN FOR BEVEL TREATMENTS

INTEGRATED WET CLEAN FOR GATE STACK DEVELOPMENT

INTEGRATED WET CLEAN FOR EPITAXIAL GROWTH

CLEANING SYSTEM WITH IN-LINE SPM PROCESSING

SPLIT GATE MEMORY CELL FABRICATION AND SYSTEM

DOPANT ANNEAL WITH STABILIZATION STEP FOR IC WITH MATCHED DEVICES

INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE

METHOD OF FABRICATING SEMICONDUCTORS

INNER L-SPACER FOR REPLACEMENT GATE FLOW

INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE

GATE SLOT OVERETCH CONTROL

INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE

INNER L-SPACER FOR REPLACEMENT GATE FLOW

HIGH-K / METAL GATE CMOS TRANSISTORS WITH TiN GATES

INNER L-SPACER FOR REPLACEMENT GATE FLOW

HIGH-K / METAL GATE CMOS TRANSISTORS WITH TiN GATES

INNER L-SPACER FOR REPLACEMENT GATE FLOW

HARD MASK FOR SOURCE/DRAIN EPITAXY CONTROL

FABRICATING A SEMICONDUCTOR DIE HAVING COEFFICIENT OF THERMAL EXPAN...

INTEGRATED CIRCUIT HAVING CHEMICALLY MODIFIED SPACER SURFACE

SEMICONDUCTOR DEVICE INCLUDING SION GATE DIELECTRIC WITH PORTIONS H...

MOS TRANSISTORS INCLUDING SiON GATE DIELECTRIC WITH ENHANCED NITROG...

DIE HAVING COEFFICIENT OF THERMAL EXPANSION GRADED LAYER

MOS TRANSISTORS INCLUDING SiON GATE DIELECTRIC WITH ENHANCED NITROG...