Brian K. Warwick

Person

Ben Lomond, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 10,877,090
- Issue date Dec 29, 2020
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins microcircuit tester
- Patent number 10,302,675
- Issue date May 28, 2019
- Johnstech International Corporation
- John E. Nelson
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Resilient interposer with electrically conductive slide-by pins as...
- Patent number 10,073,117
- Issue date Sep 11, 2018
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,678,106
- Issue date Jun 13, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Thermal management for microcircuit testing system
- Patent number 9,476,936
- Issue date Oct 25, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,297,832
- Issue date Mar 29, 2016
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 9,007,082
- Issue date Apr 14, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Microcircuit tester with slideable electrically conductive pins
- Patent number 8,937,484
- Issue date Jan 20, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Test contact system for testing integrated circuits with packages h...
- Patent number 8,912,811
- Issue date Dec 16, 2014
- Johnstech International Corporation
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Electrically conductive pins for microcircuit tester
- Patent number 8,536,889
- Issue date Sep 17, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Test contact system for testing integrated circuits with packages h...
- Patent number 8,102,184
- Issue date Jan 24, 2012
- Johnstech International
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Contact insert for a microcircuit test socket
- Patent number 7,994,808
- Issue date Aug 9, 2011
- Johnstech International Corporation
- Patrick J. Alladio
- G01 - MEASURING TESTING
Information Patent Grant
Single latch manual actuator for testing microcircuits, and having...
- Patent number 7,567,075
- Issue date Jul 28, 2009
- Cory R. Kostuchowski
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Grant
Interface apparatus for reception and delivery of an integrated cir...
- Patent number 6,889,841
- Issue date May 10, 2005
- Johnstech International Corporation
- Daniel A. Maccoux
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20190004091
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20170315169
- Publication date Nov 2, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20170276699
- Publication date Sep 28, 2017
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins Microcircuit Tester
- Publication number 20160209444
- Publication date Jul 21, 2016
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20150123689
- Publication date May 7, 2015
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20140266279
- Publication date Sep 18, 2014
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130271176
- Publication date Oct 17, 2013
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130154678
- Publication date Jun 20, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20130002285
- Publication date Jan 3, 2013
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
- Publication number 20120176151
- Publication date Jul 12, 2012
- Johnstech International Corporation
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20120062261
- Publication date Mar 15, 2012
- Johnstech International Corporation
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Electrically Conductive Pins For Microcircuit Tester
- Publication number 20100231251
- Publication date Sep 16, 2010
- John E. Nelson
- G01 - MEASURING TESTING
Information Patent Application
Test Contact System For Testing Integrated Circuits With Packages H...
- Publication number 20090302878
- Publication date Dec 10, 2009
- Jeffrey C. Sherry
- G01 - MEASURING TESTING
Information Patent Application
CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET
- Publication number 20080297142
- Publication date Dec 4, 2008
- Patrick J. Alladio
- G01 - MEASURING TESTING
Information Patent Application
CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET
- Publication number 20080218177
- Publication date Sep 11, 2008
- Johns Tech International Corporation
- Patrick J. Alladio
- G01 - MEASURING TESTING
Information Patent Application
Single latch manual actuator for testing microcircuits, and having...
- Publication number 20070029811
- Publication date Feb 8, 2007
- Cory R. Kostuchowski
- E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
Information Patent Application
Interface apparatus for reception and delivery of an integrated cir...
- Publication number 20040005812
- Publication date Jan 8, 2004
- JohnsTech International Corporation
- Daniel A. Maccoux
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Integrated circuit socket with floating alignment member
- Publication number 20030030458
- Publication date Feb 13, 2003
- Chad L. Van Hove
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Brian K. Warwick

Person

Patents Grantslast 30 patents

Electrically conductive pins for microcircuit tester

Electrically conductive pins microcircuit tester

Resilient interposer with electrically conductive slide-by pins as...

Electrically conductive pins for microcircuit tester

Thermal management for microcircuit testing system

Electrically conductive pins for microcircuit tester

Electrically conductive pins for microcircuit tester

Microcircuit tester with slideable electrically conductive pins

Test contact system for testing integrated circuits with packages h...

Electrically conductive pins for microcircuit tester

Test contact system for testing integrated circuits with packages h...

Contact insert for a microcircuit test socket

Single latch manual actuator for testing microcircuits, and having...

Interface apparatus for reception and delivery of an integrated cir...

Patents Applicationslast 30 patents

Electrically Conductive Pins Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins Microcircuit Tester

Electrically Conductive Pins Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Test Contact System For Testing Integrated Circuits With Packages H...

Electrically Conductive Pins For Microcircuit Tester

Electrically Conductive Pins For Microcircuit Tester

Test Contact System For Testing Integrated Circuits With Packages H...

CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET

CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET

Single latch manual actuator for testing microcircuits, and having...

Interface apparatus for reception and delivery of an integrated cir...

Integrated circuit socket with floating alignment member