Brian L. Brown

Person

Missouri City, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT,...
- Patent number 6,778,453
- Issue date Aug 17, 2004
- Micron Technology, Inc.
- Christopher B. Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Current controlled multi-state parallel test for semiconductor device
- Patent number 6,615,391
- Issue date Sep 2, 2003
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT...
- Patent number 6,552,945
- Issue date Apr 22, 2003
- Micron Technology, Inc.
- Christopher B. Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Two pass multi-state parallel test for semiconductor device
- Patent number 6,408,411
- Issue date Jun 18, 2002
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Current controlled multi-state parallel test for semiconductor device
- Patent number 6,381,718
- Issue date Apr 30, 2002
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Stored write scheme for high speed/wide bandwidth memory devices
- Patent number 6,351,427
- Issue date Feb 26, 2002
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for efficiently testing RAMBUS memory devices
- Patent number 6,314,036
- Issue date Nov 6, 2001
- Micron Technology, Inc.
- Christopher B. Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of storing a temperature threshold in an integrated circuit,...
- Patent number 6,233,190
- Issue date May 15, 2001
- Micron Technology, Inc.
- Christopher B. Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy test method for a semiconductor memory
- Patent number 6,208,570
- Issue date Mar 27, 2001
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for efficiently testing rambus memory devices
- Patent number 6,144,598
- Issue date Nov 7, 2000
- Micron Technology, Inc.
- Christopher B. Cooper
- G11 - INFORMATION STORAGE
Information Patent Grant
High-speed synchronous output driver
- Patent number 6,111,811
- Issue date Aug 29, 2000
- Texas Instruments Incorporated
- Daniel Bryan Penney
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock skew circuit
- Patent number 6,049,241
- Issue date Apr 11, 2000
- Texas Instruments Incorporated
- Brian L. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Architecture for high bandwidth wide I/O memory devices
- Patent number 6,028,811
- Issue date Feb 22, 2000
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock skew circuit
- Patent number 6,005,430
- Issue date Dec 21, 1999
- Texas Instruments Incorporated
- Brian L. Brown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory access circuits for test time reduction
- Patent number 5,910,923
- Issue date Jun 8, 1999
- Texas Instruments Incorporated
- Brian L. Brown
- G11 - INFORMATION STORAGE
Information Patent Grant
Interface level programmability
- Patent number 5,557,219
- Issue date Sep 17, 1996
- Texas Instruments Incorporated
- Roger D. Norwood
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Power-saver differential input buffer
- Patent number 5,440,248
- Issue date Aug 8, 1995
- Texas Instruments Incorporated
- Brian L. Brown
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Methods of storing a temperature in an integrated circuit, method o...
- Publication number 20030174559
- Publication date Sep 18, 2003
- Christopher B. Cooper
- G11 - INFORMATION STORAGE
Information Patent Application
Current controlled multi-state parallel test for semiconductor device
- Publication number 20020080668
- Publication date Jun 27, 2002
- Brian L. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for storing a temperature threshold in an integrated circuit...
- Publication number 20010009528
- Publication date Jul 26, 2001
- Christopher B. Cooper
- G11 - INFORMATION STORAGE

Brian L. Brown

Person

Patents Grantslast 30 patents

METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT,...

Current controlled multi-state parallel test for semiconductor device

METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT...

Two pass multi-state parallel test for semiconductor device

Current controlled multi-state parallel test for semiconductor device

Stored write scheme for high speed/wide bandwidth memory devices

Method and apparatus for efficiently testing RAMBUS memory devices

Method of storing a temperature threshold in an integrated circuit,...

Redundancy test method for a semiconductor memory

Method and apparatus for efficiently testing rambus memory devices

High-speed synchronous output driver

Clock skew circuit

Architecture for high bandwidth wide I/O memory devices

Clock skew circuit

Memory access circuits for test time reduction

Interface level programmability

Power-saver differential input buffer

Patents Applicationslast 30 patents

Methods of storing a temperature in an integrated circuit, method o...

Current controlled multi-state parallel test for semiconductor device

Method for storing a temperature threshold in an integrated circuit...