Brian Lawrence Gilmore

Person

Foristell, MO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer support ring
- Patent number 8,420,554
- Issue date Apr 16, 2013
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low thermal mass semiconductor wafer plate
- Patent number 8,220,646
- Issue date Jul 17, 2012
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low thermal mass semiconductor wafer boat
- Patent number 8,220,647
- Issue date Jul 17, 2012
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for annealing semiconductor wafers with flat dopant depth p...
- Patent number 8,153,538
- Issue date Apr 10, 2012
- MEMC Electronic Materials, Inc.
- Larry Wayne Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for producing smooth wafers
- Patent number 8,058,173
- Issue date Nov 15, 2011
- MEMC Electronic Materials, Inc.
- Larry W. Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low thermal mass semiconductor wafer support
- Patent number 8,042,697
- Issue date Oct 25, 2011
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High purity silicon carbide structures
- Patent number 7,888,685
- Issue date Feb 15, 2011
- MEMC Electronic Materials, Inc.
- Larry Wayne Shive
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Grant
Method for purifying silicon carbide coated structures
- Patent number 7,696,103
- Issue date Apr 13, 2010
- MEMC Electronic Materials, Inc.
- Larry Wayne Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for metallic contamination reduction in silicon wafers
- Patent number 7,084,048
- Issue date Aug 1, 2006
- MEMC Electronic Materials, Inc.
- Larry W. Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer boat for a vertical furnace
- Patent number 7,033,168
- Issue date Apr 25, 2006
- MEMC Electronic Materials, Inc.
- Puneet Gupta
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Low Thermal Mass Semiconductor Wafer Plate
- Publication number 20120074081
- Publication date Mar 29, 2012
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low Thermal Mass Semiconductor Wafer Boat
- Publication number 20120077138
- Publication date Mar 29, 2012
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Support Ring
- Publication number 20110269316
- Publication date Nov 3, 2011
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods of Making Wafer Supports
- Publication number 20100304022
- Publication date Dec 2, 2010
- MEMC Electronic Materials, Inc.
- Larry W. Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPORT FOR A SEMICONDUCTOR WAFER IN A HIGH TEMPERATURE ENVIRONMENT
- Publication number 20100098519
- Publication date Apr 22, 2010
- MEMC Electronic Materials, Inc.
- Larry Wayne Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW THERMAL MASS SEMICONDUCTOR WAFER SUPPORT
- Publication number 20090321372
- Publication date Dec 31, 2009
- MEMC Electronic Materials, Inc.
- Brian Lawrence Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Support and Method of Making Wafer Support
- Publication number 20080156260
- Publication date Jul 3, 2008
- MEMC Electronic Materials, Inc.
- Larry W. Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR PRODUCING SMOOTH WAFERS
- Publication number 20080160788
- Publication date Jul 3, 2008
- MEMC Electronic Materials, Inc.
- Larry W. Shive
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer Platform
- Publication number 20080041798
- Publication date Feb 21, 2008
- MEMC Electronic Materials, Inc.
- Brian L. Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PURIFYING SILICON CARBIDE COATED STRUCTURES
- Publication number 20070221609
- Publication date Sep 27, 2007
- MEMC Electronic Materials, Inc.
- Larry Wayne Shive
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
Method for purifying silicon carbide coated structures
- Publication number 20060024969
- Publication date Feb 2, 2006
- MEMC Electronic Materials, Inc.
- Larry Wayne Shive
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES
Information Patent Application
Process for metallic contamination reduction in silicon wafers
- Publication number 20050250297
- Publication date Nov 10, 2005
- MEMC Electronic Materials, Inc.
- Larry W. Shive
- H01 - BASIC ELECTRIC ELEMENTS

Brian Lawrence Gilmore

Person

Patents Grantslast 30 patents

Wafer support ring

Low thermal mass semiconductor wafer plate

Low thermal mass semiconductor wafer boat

Process for annealing semiconductor wafers with flat dopant depth p...

Methods for producing smooth wafers

Low thermal mass semiconductor wafer support

High purity silicon carbide structures

Method for purifying silicon carbide coated structures

Process for metallic contamination reduction in silicon wafers

Semiconductor wafer boat for a vertical furnace

Patents Applicationslast 30 patents

Low Thermal Mass Semiconductor Wafer Plate

Low Thermal Mass Semiconductor Wafer Boat

Wafer Support Ring

Methods of Making Wafer Supports

SUPPORT FOR A SEMICONDUCTOR WAFER IN A HIGH TEMPERATURE ENVIRONMENT

LOW THERMAL MASS SEMICONDUCTOR WAFER SUPPORT

Wafer Support and Method of Making Wafer Support

METHODS FOR PRODUCING SMOOTH WAFERS

Wafer Platform

METHOD FOR PURIFYING SILICON CARBIDE COATED STRUCTURES

Method for purifying silicon carbide coated structures

Process for metallic contamination reduction in silicon wafers