Brian Leslie

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detecting defects on a specimen using a com...
- Patent number 7,711,177
- Issue date May 4, 2010
- KLA-Tencor Technologies Corp.
- Brian Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,656,170
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 7,477,372
- Issue date Jan 13, 2009
- KLA-Tencor Technologies Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 7,075,637
- Issue date Jul 11, 2006
- KLA-Tencor Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,012,439
- Issue date Mar 14, 2006
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 6,888,627
- Issue date May 3, 2005
- KLA-Tencor Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,867,606
- Issue date Mar 15, 2005
- KLA-Tencor Technologies, Inc.
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 6,566,885
- Issue date May 20, 2003
- KLA Tencor
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for generating spatially resolved voltage con...
- Patent number 6,445,199
- Issue date Sep 3, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for optimizing semiconductor inspection tools
- Patent number 6,433,561
- Issue date Aug 13, 2002
- KLA-Tencor Corporation
- Akella V. S. Satya
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanning system for surface inspection
- Patent number 6,081,325
- Issue date Jun 27, 2000
- KLA-Tencor Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Grant
Process for inspecting patterned wafers
- Patent number 5,355,212
- Issue date Oct 11, 1994
- Tencor Instruments
- Keith B. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive spatial filter for surface inspection
- Patent number 5,276,498
- Issue date Jan 4, 1994
- Tencor Instruments
- Lee K. Galbraith
- G02 - OPTICS
Information Patent Grant
Position location in surface scanning using interval timing between...
- Patent number 5,083,035
- Issue date Jan 21, 1992
- Tencor Instruments
- Jiri Pecen
- G02 - OPTICS
Information Patent Grant
Force delivery system for improved precision membrane probe
- Patent number 4,980,637
- Issue date Dec 25, 1990
- Hewlett-Packard Company
- Richard E. Huff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...
- Publication number 20080237487
- Publication date Oct 2, 2008
- KLA-TENCOR
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Detecting Defects on a Specimen Using a Com...
- Publication number 20070286473
- Publication date Dec 13, 2007
- KLA-TENCOR TECHNOLOGIES CORP.
- Brian Leslie
- G01 - MEASURING TESTING
Information Patent Application
Optical Scanning System For Surface Inspection
- Publication number 20070188744
- Publication date Aug 16, 2007
- KLA-Tencor Technologies Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Optical Scanning System for Surface Inspection
- Publication number 20060203235
- Publication date Sep 14, 2006
- KLA-Tencor Technologies Corporation
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Multiple directional scans of test structures on semiconductor inte...
- Publication number 20050139767
- Publication date Jun 30, 2005
- KLA-TENCOR
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Scanning system for inspecting anamolies on surfaces
- Publication number 20050110986
- Publication date May 26, 2005
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Optical scanning system for surface inspection
- Publication number 20030227619
- Publication date Dec 11, 2003
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Optical scanning system for surface inspection
- Publication number 20030206294
- Publication date Nov 6, 2003
- Brian C. Leslie
- G01 - MEASURING TESTING
Information Patent Application
Multiple directional scans of test structures on srmiconductor inte...
- Publication number 20030155927
- Publication date Aug 21, 2003
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- G01 - MEASURING TESTING
Information Patent Application
Scanning system for inspecting anamolies on surfaces
- Publication number 20020097393
- Publication date Jul 25, 2002
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING

Brian Leslie

Person

Patents Grantslast 30 patents

Methods and systems for detecting defects on a specimen using a com...

Multiple directional scans of test structures on semiconductor inte...

Optical scanning system for surface inspection

Optical scanning system for surface inspection

Multiple directional scans of test structures on semiconductor inte...

Optical scanning system for surface inspection

Multiple directional scans of test structures on semiconductor inte...

Multiple directional scans of test structures on semiconductor inte...

Methods and apparatus for generating spatially resolved voltage con...

Methods and apparatus for optimizing semiconductor inspection tools

Optical scanning system for surface inspection

Process for inspecting patterned wafers

Adaptive spatial filter for surface inspection

Position location in surface scanning using interval timing between...

Force delivery system for improved precision membrane probe

Patents Applicationslast 30 patents

MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...

Methods and Systems for Detecting Defects on a Specimen Using a Com...

Optical Scanning System For Surface Inspection

Optical Scanning System for Surface Inspection

Multiple directional scans of test structures on semiconductor inte...

Scanning system for inspecting anamolies on surfaces

Optical scanning system for surface inspection

Optical scanning system for surface inspection

Multiple directional scans of test structures on srmiconductor inte...

Scanning system for inspecting anamolies on surfaces