Brian M. Trapp

Person

Poughkeepsie, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Security control of analysis results
- Patent number 8,429,193
- Issue date Apr 23, 2013
- International Business Machines Corporation
- Yunsheng Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Design structure and system for identification of defects on circui...
- Patent number 7,752,581
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Mary Lanzerotti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system of data weighted object orientation for data mining
- Patent number 7,751,920
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Thomas P. Moyer
- G01 - MEASURING TESTING
Information Patent Grant
Equivalent gate count yield estimation for integrated circuit devices
- Patent number 7,477,961
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for identification of defects on circuits or other arrayed p...
- Patent number 7,346,470
- Issue date Mar 18, 2008
- International Business Machines Corporation
- Mary Wisniewski
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SECURITY CONTROL OF ANALYSIS RESULTS
- Publication number 20100185675
- Publication date Jul 22, 2010
- International Business Machines Corporation
- Yunsheng Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20090112352
- Publication date Apr 30, 2009
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design Structure and System for Identification of Defects on Circui...
- Publication number 20080148201
- Publication date Jun 19, 2008
- International Business Machines Corporation
- Mary Lanzerotti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM OF DATA WEIGHTED OBJECT ORIENTATION FOR DATA MINING
- Publication number 20080140247
- Publication date Jun 12, 2008
- International Business Machines Corporation
- Thomas P. Moyer
- G01 - MEASURING TESTING
Information Patent Application
Design Structure and System for Identification of Defects on Circui...
- Publication number 20080092095
- Publication date Apr 17, 2008
- Mary Lanzerotti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...
- Publication number 20070265722
- Publication date Nov 15, 2007
- International Business Machines Corporation
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for identification of defects on circuits or other arrayed p...
- Publication number 20060265185
- Publication date Nov 23, 2006
- International Business Machines Corporation
- Mary Lanzerotti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for identification of defects on circuits or other arrayed p...
- Publication number 20040254752
- Publication date Dec 16, 2004
- International Business Machines Corporation
- Mary Wisniewski
- H01 - BASIC ELECTRIC ELEMENTS

Brian M. Trapp

Person

Patents Grantslast 30 patents

Security control of analysis results

Design structure and system for identification of defects on circui...

Method and system of data weighted object orientation for data mining

Equivalent gate count yield estimation for integrated circuit devices

System for identification of defects on circuits or other arrayed p...

Patents Applicationslast 30 patents

SECURITY CONTROL OF ANALYSIS RESULTS

EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTEGRATED CIRCUIT DEVICES

Design Structure and System for Identification of Defects on Circui...

METHOD AND SYSTEM OF DATA WEIGHTED OBJECT ORIENTATION FOR DATA MINING

Design Structure and System for Identification of Defects on Circui...

METHOD FOR IMPROVED EQUIVALENT GATE COUNT YIELD ESTIMATION FOR INTE...

System for identification of defects on circuits or other arrayed p...

System for identification of defects on circuits or other arrayed p...