Brian Mason

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Aloha, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Secure test-for-yield chip diagnostics management system and method
- Patent number 8,626,460
- Issue date Jan 7, 2014
- Teseda Corporation
- Bruce Kaufman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Secure test-for-yield chip diagnostics management system and method
- Publication number 20100332172
- Publication date Dec 30, 2010
- Bruce Kaufman
- G01 - MEASURING TESTING