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Brian McHugh
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Phoenix, AZ, US
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last 30 patents
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Patent Grant
Approach for fabricating probe elements for probe card assemblies u...
Patent number
7,637,009
Issue date
Dec 29, 2009
SV Probe Pte. Ltd.
Keith Heinemann
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Approach for fabricating probe elements for probe card assemblies u...
Publication number
20070222466
Publication date
Sep 27, 2007
Keith Heinemann
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
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Patent Application
Multi-layered probes
Publication number
20070200576
Publication date
Aug 30, 2007
Edward T. Laurent
G01 - MEASURING TESTING