Brian Neal Caldwell

Person

Milton, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,996,000
- Issue date Jun 12, 2018
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,989,843
- Issue date Jun 5, 2018
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern layout for test photomask and method for evaluating cr...
- Patent number 9,372,394
- Issue date Jun 21, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for feature function aware priority printing
- Patent number 8,586,950
- Issue date Nov 19, 2013
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for feature function aware priority printing
- Patent number 8,227,774
- Issue date Jul 24, 2012
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of compensating for defective pattern generation data in a v...
- Patent number 7,496,885
- Issue date Feb 24, 2009
- International Business Machines Corporation
- Brian Neal Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Adaptive electrostatic pin chuck
- Patent number 7,198,276
- Issue date Apr 3, 2007
- International Business Machines Corporation
- Brian Neal Caldwell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20160223902
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20160224720
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...
- Publication number 20150212405
- Publication date Jul 30, 2015
- Toppan Printing Co., Ltd.
- Brian N. Caldwell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING
- Publication number 20120204136
- Publication date Aug 9, 2012
- International Business Machines Corporation
- Brian Neal CALDWELL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING
- Publication number 20110165502
- Publication date Jul 7, 2011
- INTERNATIONAL BUINESS MACHINE CORPORATION
- Brian Neal CALDWELL
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ADAPTIVE ELECTROSTATIC PIN CHUCK
- Publication number 20050087939
- Publication date Apr 28, 2005
- International Business Machines Corporation
- Brian Neal Caldwell
- H01 - BASIC ELECTRIC ELEMENTS

Brian Neal Caldwell

Person

Patents Grantslast 30 patents

Test pattern layout for test photomask and method for evaluating cr...

Test pattern layout for test photomask and method for evaluating cr...

Test pattern layout for test photomask and method for evaluating cr...

Method and system for feature function aware priority printing

Method and system for feature function aware priority printing

Method of compensating for defective pattern generation data in a v...

Adaptive electrostatic pin chuck

Patents Applicationslast 30 patents

TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...

TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...

TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CR...

METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING

METHOD AND SYSTEM FOR FEATURE FUNCTION AWARE PRIORITY PRINTING

ADAPTIVE ELECTROSTATIC PIN CHUCK