Brian R. Bobrzynski

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Pittsburgh, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
In-situ wafer and probe desorption using closed loop heating
- Patent number 7,304,490
- Issue date Dec 4, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining concentration of defects and/o...
- Patent number 7,190,186
- Issue date Mar 13, 2007
- Solid State Measurements, Inc.
- William H. Howland, Jr.
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
In-situ wafer and probe desorption using closed loop heating
- Publication number 20060097740
- Publication date May 11, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining concentration of defects and/o...
- Publication number 20060066323
- Publication date Mar 30, 2006
- Solid State Measurements, Inc.
- William H. Howland
- G01 - MEASURING TESTING