Brian Roberts Routh JR.

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Microscopy feedback for improved milling accuracy
- Patent number 12,249,482
- Issue date Mar 11, 2025
- FEI Company
- Thomas Gary Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,847,813
- Issue date Dec 19, 2023
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of material deposition
- Patent number 11,798,804
- Issue date Oct 24, 2023
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Line-based endpoint detection
- Patent number 11,355,313
- Issue date Jun 7, 2022
- FEI Company
- Brian Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Artificial intelligence-enabled preparation end-pointing
- Patent number 11,176,656
- Issue date Nov 16, 2021
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for backside planar view lamella preparation
- Patent number 11,069,509
- Issue date Jul 20, 2021
- FEI Company
- James Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of material deposition
- Patent number 11,069,523
- Issue date Jul 20, 2021
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,825,651
- Issue date Nov 3, 2020
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,340,119
- Issue date Jul 2, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Preparation of lamellae for TEM viewing
- Patent number 10,068,749
- Issue date Sep 4, 2018
- FEI Company
- Scott Edward Fuller
- G01 - MEASURING TESTING
Information Patent Grant
Method of material deposition
- Patent number 9,978,586
- Issue date May 22, 2018
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Source for selectively providing positively or negatively charged p...
- Patent number 9,601,312
- Issue date Mar 21, 2017
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 9,601,313
- Issue date Mar 21, 2017
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High capacity TEM grid
- Patent number 9,281,163
- Issue date Mar 8, 2016
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Grant
Source for selectively providing positively or negatively charged p...
- Patent number 9,275,828
- Issue date Mar 1, 2016
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Grant
Method of preparing and imaging a lamella in a particle-optical app...
- Patent number 8,766,214
- Issue date Jul 1, 2014
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively coupled plasma source as an electron beam source for sp...
- Patent number 8,716,673
- Issue date May 6, 2014
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20240071040
- Publication date Feb 29, 2024
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREPARING A SPECIMEN
- Publication number 20240071720
- Publication date Feb 29, 2024
- FEI Company
- Jamie Dee Gravell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY
- Publication number 20230197403
- Publication date Jun 22, 2023
- FEI Company
- Thomas Gary Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20220067915
- Publication date Mar 3, 2022
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LINE-BASED ENDPOINT DETECTION
- Publication number 20210407765
- Publication date Dec 30, 2021
- FEI Company
- Brian Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20210118678
- Publication date Apr 22, 2021
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING
- Publication number 20200279362
- Publication date Sep 3, 2020
- FEI Company
- Thomas Gary Miller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20190272975
- Publication date Sep 5, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20180277361
- Publication date Sep 27, 2018
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20170256380
- Publication date Sep 7, 2017
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MATERIAL DEPOSITION
- Publication number 20170133220
- Publication date May 11, 2017
- FEI Company
- Brian Roberts Routh
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SOURCE FOR SELECTIVELY PROVIDING POSITIVELY OR NEGATIVELY CHARGED P...
- Publication number 20160172156
- Publication date Jun 16, 2016
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20160141147
- Publication date May 19, 2016
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Capacity TEM Grid
- Publication number 20150294834
- Publication date Oct 15, 2015
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
Source for Selectively Providing Positively or Negatively Charged P...
- Publication number 20140326877
- Publication date Nov 6, 2014
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY
Information Patent Application
PREPARATION OF LAMELLAE FOR TEM VIEWING
- Publication number 20130319849
- Publication date Dec 5, 2013
- FEI Company
- Scott Edward Fuller
- G01 - MEASURING TESTING
Information Patent Application
Inductively Coupled Plasma Source as an Electron Beam Source for Sp...
- Publication number 20130134307
- Publication date May 30, 2013
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING

Brian Roberts Routh JR.

Person

Patents Grantslast 30 patents

Microscopy feedback for improved milling accuracy

Artificial intelligence-enabled preparation end-pointing

Method of material deposition

Line-based endpoint detection

Artificial intelligence-enabled preparation end-pointing

Method and system for backside planar view lamella preparation

Method of material deposition

Automated TEM sample preparation

Automated TEM sample preparation

Preparation of lamellae for TEM viewing

Method of material deposition

Source for selectively providing positively or negatively charged p...

Automated TEM sample preparation

High capacity TEM grid

Source for selectively providing positively or negatively charged p...

Method of preparing and imaging a lamella in a particle-optical app...

Inductively coupled plasma source as an electron beam source for sp...

Patents Applicationslast 30 patents

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

METHOD AND SYSTEM FOR PREPARING A SPECIMEN

MICROSCOPY FEEDBACK FOR IMPROVED MILLING ACCURACY

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

LINE-BASED ENDPOINT DETECTION

METHOD OF MATERIAL DEPOSITION

ARTIFICIAL INTELLIGENCE-ENABLED PREPARATION END-POINTING

AUTOMATED TEM SAMPLE PREPARATION

METHOD OF MATERIAL DEPOSITION

AUTOMATED TEM SAMPLE PREPARATION

METHOD OF MATERIAL DEPOSITION

SOURCE FOR SELECTIVELY PROVIDING POSITIVELY OR NEGATIVELY CHARGED P...

AUTOMATED TEM SAMPLE PREPARATION

High Capacity TEM Grid

Source for Selectively Providing Positively or Negatively Charged P...

METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...

PREPARATION OF LAMELLAE FOR TEM VIEWING

Inductively Coupled Plasma Source as an Electron Beam Source for Sp...