Brian Sadler

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San Jose, CA, US

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Patents Grantslast 30 patents

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Testing differential signal standards using device under test's bui...
- Patent number 7,728,604
- Issue date Jun 1, 2010
- Xilinx, Inc.
- Tuyet Ngoc Simmons
- G01 - MEASURING TESTING
Information Patent Grant
Test channel usage reduction
- Patent number 7,392,446
- Issue date Jun 24, 2008
- Xilinx, Inc.
- Tuyet Ngoc Simmons
- G01 - MEASURING TESTING
Information Patent Grant
Testing of conducting paths using a high speed I/O test package
- Patent number 6,809,524
- Issue date Oct 26, 2004
- Xilinx, Inc.
- Brian Sadler
- G01 - MEASURING TESTING