Brian Tilley

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Richardson, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Particle beam profiles for analytic equipment configuration
- Patent number 11,508,549
- Issue date Nov 22, 2022
- FEI Company
- Herman Carlo Floresca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam focusing
- Patent number 11,328,895
- Issue date May 10, 2022
- FEI Company
- Herman Carlo Floresca
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TECHNIQUES FOR DETECTING PROBE LANDING IN INTEGRATED CIRCUIT TESTIN...
- Publication number 20240410937
- Publication date Dec 12, 2024
- FEI Company
- James S. Vickers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM FOCUSING
- Publication number 20220028647
- Publication date Jan 27, 2022
- FEI Company
- Herman Carlo Floresca
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM PROFILES FOR ANALYTIC EQUIPMENT CONFIGURATION
- Publication number 20210125808
- Publication date Apr 29, 2021
- FEI Company
- Herman Carlo Floresca
- H01 - BASIC ELECTRIC ELEMENTS