Brock J. LaMeres

Person

Colorado Springs, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe accessories, and methods for probing test points using same
- Patent number 7,492,173
- Issue date Feb 17, 2009
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for probing at arbitrary locations within an i...
- Patent number 7,372,284
- Issue date May 13, 2008
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Board-to-board electronic interface using hemi-ellipsoidal surface...
- Patent number 7,338,292
- Issue date Mar 4, 2008
- Agilent Technologies, Inc.
- Kenneth W Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe having a frame to align spring pins perpendicularly to a prin...
- Patent number 7,323,892
- Issue date Jan 29, 2008
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Regenerator probe
- Patent number 7,282,935
- Issue date Oct 16, 2007
- Agilent Technologies, Inc.
- Glenn Wood
- G01 - MEASURING TESTING
Information Patent Grant
Signal probe and probe assembly
- Patent number 7,242,202
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Joseph Groshong
- G01 - MEASURING TESTING
Information Patent Grant
Probe retention kit, and system and method for probing a pattern of...
- Patent number 7,242,203
- Issue date Jul 10, 2007
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Incorporation of isolation resistor(s) into probes using probe tip...
- Patent number 7,183,781
- Issue date Feb 27, 2007
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method, and kit for probing a pattern of points on a pri...
- Patent number 7,145,352
- Issue date Dec 5, 2006
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly with controlled impedance spring pin or resistor tip...
- Patent number 7,116,121
- Issue date Oct 3, 2006
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Grant
Probes with perpendicularly disposed spring pins, and methods of ma...
- Patent number 7,046,020
- Issue date May 16, 2006
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Electronic probe extender
- Patent number 7,025,628
- Issue date Apr 11, 2006
- Agilent Technologies, Inc.
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Grant
Alignment/retention device for connector-less probe
- Patent number 6,822,466
- Issue date Nov 23, 2004
- Agilent Technologies, Inc.
- Brent A. Holcombe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE HAVING A FRAME TO ALIGN SPRING PINS PERPENDICULARLY TO A PRIN...
- Publication number 20070296425
- Publication date Dec 27, 2007
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for probing at arbitrary locations within an i...
- Publication number 20070176611
- Publication date Aug 2, 2007
- Brent A. Holcombe
- G01 - MEASURING TESTING
Information Patent Application
Regenerator probe
- Publication number 20070170936
- Publication date Jul 26, 2007
- Glenn Wood
- G01 - MEASURING TESTING
Information Patent Application
Board-to-board electronic interface using hemi-ellipsoidal surface...
- Publication number 20070173080
- Publication date Jul 26, 2007
- Kenneth W. Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probe accessories, and methods for probing test point using same
- Publication number 20070159191
- Publication date Jul 12, 2007
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Incorporation of Isolation Resistor(s) into Probes using Probe Tip...
- Publication number 20070115014
- Publication date May 24, 2007
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Signal probe and probe assembly
- Publication number 20060267606
- Publication date Nov 30, 2006
- Joseph Groshong
- G01 - MEASURING TESTING
Information Patent Application
Connectorless electronic interface between rigid and compliant memb...
- Publication number 20060249303
- Publication date Nov 9, 2006
- Kenneth W. Johnson
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus, method, and kit for probing a pattern of points on a pri...
- Publication number 20060033513
- Publication date Feb 16, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Incorporation of isolation resistor(s) into probes using probe tip...
- Publication number 20060033514
- Publication date Feb 16, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Probe retention kit, and system and method for probing a pattern of...
- Publication number 20060033518
- Publication date Feb 16, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Backside attach probe, components thereof, and methods for making a...
- Publication number 20060022692
- Publication date Feb 2, 2006
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Probes with perpendicularly disposed spring pins, and methods of ma...
- Publication number 20050179454
- Publication date Aug 18, 2005
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
Electronic probe extender
- Publication number 20050037649
- Publication date Feb 17, 2005
- Brock J. LaMeres
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FABRICATING ADAPTOR FOR ALIGNING AND ELECTRICALLY COUPLI...
- Publication number 20040007762
- Publication date Jan 15, 2004
- Brock J. LaMeres
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Brock J. LaMeres

Person

Patents Grantslast 30 patents

Probe accessories, and methods for probing test points using same

Method and apparatus for probing at arbitrary locations within an i...

Board-to-board electronic interface using hemi-ellipsoidal surface...

Probe having a frame to align spring pins perpendicularly to a prin...

Regenerator probe

Signal probe and probe assembly

Probe retention kit, and system and method for probing a pattern of...

Incorporation of isolation resistor(s) into probes using probe tip...

Apparatus, method, and kit for probing a pattern of points on a pri...

Probe assembly with controlled impedance spring pin or resistor tip...

Probes with perpendicularly disposed spring pins, and methods of ma...

Electronic probe extender

Alignment/retention device for connector-less probe

Patents Applicationslast 30 patents

PROBE HAVING A FRAME TO ALIGN SPRING PINS PERPENDICULARLY TO A PRIN...

Method and apparatus for probing at arbitrary locations within an i...

Regenerator probe

Board-to-board electronic interface using hemi-ellipsoidal surface...

Probe accessories, and methods for probing test point using same

Incorporation of Isolation Resistor(s) into Probes using Probe Tip...

Signal probe and probe assembly

Connectorless electronic interface between rigid and compliant memb...

Apparatus, method, and kit for probing a pattern of points on a pri...

Incorporation of isolation resistor(s) into probes using probe tip...

Probe retention kit, and system and method for probing a pattern of...

Backside attach probe, components thereof, and methods for making a...

Probes with perpendicularly disposed spring pins, and methods of ma...

Electronic probe extender

METHOD FOR FABRICATING ADAPTOR FOR ALIGNING AND ELECTRICALLY COUPLI...