Bruce A. Liikanen

Person

Berthoud, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adjustment of a starting voltage corresponding to a program operati...
- Patent number 12,125,539
- Issue date Oct 22, 2024
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adjustment of program verify targets corresponding to a last progra...
- Patent number 12,040,026
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with dynamic processing level calibration
- Patent number 12,001,286
- Issue date Jun 4, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Logic based read sample offset in a memory sub-system
- Patent number 11,983,065
- Issue date May 14, 2024
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory sub-system with dynamic calibration using component-based fu...
- Patent number 11,953,980
- Issue date Apr 9, 2024
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tracking and refreshing state metrics in memory sub-systems
- Patent number 11,955,194
- Issue date Apr 9, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with dynamic program-verify voltage calibration
- Patent number 11,934,666
- Issue date Mar 19, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
First-pass continuous read level calibration
- Patent number 11,908,536
- Issue date Feb 20, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Adjusting program effective time using program step characteristics
- Patent number 11,887,676
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block family-based error avoidance for memory devices
- Patent number 11,886,726
- Issue date Jan 30, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determination of state metrics of memory sub-systems following powe...
- Patent number 11,862,274
- Issue date Jan 2, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Combining sets of memory blocks in a memory device
- Patent number 11,853,556
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage bin boundary calibration at memory device power up
- Patent number 11,842,772
- Issue date Dec 12, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Open block family duration limited by temperature variation
- Patent number 11,842,061
- Issue date Dec 12, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory element profiling and operational adjustments
- Patent number 11,836,345
- Issue date Dec 5, 2023
- Micron Technology, Inc.
- Francis Chew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating embedded data in memory cells in a memory sub-system
- Patent number 11,817,152
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage offset bin selection based on die family in memor...
- Patent number 11,791,004
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Estimation of read level thresholds using a data structure
- Patent number 11,789,640
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Changing of memory components to be used for a stripe based on an e...
- Patent number 11,748,008
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic program erase targeting with bit error rate
- Patent number 11,742,027
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read sample offset bit determination in a memory sub-system
- Patent number 11,733,928
- Issue date Aug 22, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Performing threshold voltage offset bin selection by package for me...
- Patent number 11,727,994
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic background scan optimization in a memory sub-system
- Patent number 11,714,580
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Offset memory component automatic calibration (autocal) error recov...
- Patent number 11,715,530
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Grant
Enhanced block management for a memory subsystem
- Patent number 11,714,709
- Issue date Aug 1, 2023
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Write data for bin resynchronization after power loss
- Patent number 11,709,775
- Issue date Jul 25, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read level calibration in memory devices using embedded servo cells
- Patent number 11,705,208
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory sub-system with background scan and histogram statistics
- Patent number 11,705,215
- Issue date Jul 18, 2023
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error-handling flows in memory devices based on bins
- Patent number 11,693,745
- Issue date Jul 4, 2023
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple open block families supporting multiple cursors of a memor...
- Patent number 11,675,509
- Issue date Jun 13, 2023
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT
- Publication number 20250044948
- Publication date Feb 6, 2025
- Lodestar Licensing Group, LLC
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTMENT OF PROGRAM VERIFY TARGETS CORRESPONDING TO A LAST PROGRA...
- Publication number 20240331780
- Publication date Oct 3, 2024
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION
- Publication number 20240289226
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS
- Publication number 20240265989
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SUB-SYSTEM WITH DYNAMIC CALIBRATION USING COMPONENT-BASED FU...
- Publication number 20240248785
- Publication date Jul 25, 2024
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BLOCK FAMILY-BASED ERROR AVOIDANCE FOR MEMORY DEVICES
- Publication number 20240111445
- Publication date Apr 4, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPEN BLOCK FAMILY DURATION LIMITED BY TEMPERATURE VARIATION
- Publication number 20240045605
- Publication date Feb 8, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS
- Publication number 20230245708
- Publication date Aug 3, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINATION OF STATE METRICS OF MEMORY SUB-SYSTEMS FOLLOWING POWE...
- Publication number 20230207043
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
OPEN BLOCK FAMILY DURATION LIMITED BY TIME AND TEMPERATURE
- Publication number 20230153003
- Publication date May 18, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THRESHOLD VOLTAGE OFFSET BIN SELECTION BASED ON DIE FAMILY IN MEMOR...
- Publication number 20230115960
- Publication date Apr 13, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SUB-SYSTEM WITH DYNAMIC CALIBRATION USING COMPONENT-BASED FU...
- Publication number 20230099349
- Publication date Mar 30, 2023
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FIRST-PASS CONTINUOUS READ LEVEL CALIBRATION
- Publication number 20230054653
- Publication date Feb 23, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
GENERATING EMBEDDED DATA IN MEMORY CELLS IN A MEMORY SUB-SYSTEM
- Publication number 20220406381
- Publication date Dec 22, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC BACKGROUND SCAN OPTIMIZATION IN A MEMORY SUB-SYSTEM
- Publication number 20220350538
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTMENT OF A STARTING VOLTAGE CORRESPONDING TO A PROGRAM OPERATI...
- Publication number 20220343981
- Publication date Oct 27, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSOCIATING MULTIPLE CURSORS WITH BLOCK FAMILY OF MEMORY DEVICE
- Publication number 20220334721
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE BIN BOUNDARY CALIBRATION AT MEMORY DEVICE POWER UP
- Publication number 20220336021
- Publication date Oct 20, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOV...
- Publication number 20220301640
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G11 - INFORMATION STORAGE
Information Patent Application
COMBINING SETS OF MEMORY BLOCKS IN A MEMORY DEVICE
- Publication number 20220300166
- Publication date Sep 22, 2022
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION
- Publication number 20220291847
- Publication date Sep 15, 2022
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC PROGRAM ERASE TARGETING WITH BIT ERROR RATE
- Publication number 20220284967
- Publication date Sep 8, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION
- Publication number 20220276930
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT
- Publication number 20220269420
- Publication date Aug 25, 2022
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ SAMPLE OFFSET BIT DETERMINATION IN A MEMORY SUB-SYSTEM
- Publication number 20220214837
- Publication date Jul 7, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WRITE DATA FOR BIN RESYNCHRONIZATION AFTER POWER LOSS
- Publication number 20220197795
- Publication date Jun 23, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SUB-SYSTEM WITH BACKGROUND SCAN AND HISTOGRAM STATISTICS
- Publication number 20220180962
- Publication date Jun 9, 2022
- Micron Technology, Inc.
- Gerald L. Cadloni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR-HANDLING FLOWS IN MEMORY DEVICES BASED ON BINS
- Publication number 20220164263
- Publication date May 26, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE-BASED BLOCK FAMILY COMBINATIONS IN A MEMORY DEVICE
- Publication number 20220164112
- Publication date May 26, 2022
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIPLE OPEN BLOCK FAMILIES SUPPORTING MULTIPLE CURSORS OF A MEMOR...
- Publication number 20220137814
- Publication date May 5, 2022
- Micron Technology, Inc.
- Shane Nowell
- G06 - COMPUTING CALCULATING COUNTING

Bruce A. Liikanen

Person

Patents Grantslast 30 patents

Adjustment of a starting voltage corresponding to a program operati...

Adjustment of program verify targets corresponding to a last progra...

Memory device with dynamic processing level calibration

Logic based read sample offset in a memory sub-system

Memory sub-system with dynamic calibration using component-based fu...

Tracking and refreshing state metrics in memory sub-systems

Memory device with dynamic program-verify voltage calibration

First-pass continuous read level calibration

Adjusting program effective time using program step characteristics

Block family-based error avoidance for memory devices

Determination of state metrics of memory sub-systems following powe...

Combining sets of memory blocks in a memory device

Voltage bin boundary calibration at memory device power up

Open block family duration limited by temperature variation

Memory element profiling and operational adjustments

Generating embedded data in memory cells in a memory sub-system

Threshold voltage offset bin selection based on die family in memor...

Estimation of read level thresholds using a data structure

Changing of memory components to be used for a stripe based on an e...

Dynamic program erase targeting with bit error rate

Read sample offset bit determination in a memory sub-system

Performing threshold voltage offset bin selection by package for me...

Dynamic background scan optimization in a memory sub-system

Offset memory component automatic calibration (autocal) error recov...

Enhanced block management for a memory subsystem

Write data for bin resynchronization after power loss

Read level calibration in memory devices using embedded servo cells

Memory sub-system with background scan and histogram statistics

Error-handling flows in memory devices based on bins

Multiple open block families supporting multiple cursors of a memor...

Patents Applicationslast 30 patents

DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT

ADJUSTMENT OF PROGRAM VERIFY TARGETS CORRESPONDING TO A LAST PROGRA...

MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION

TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS

MEMORY SUB-SYSTEM WITH DYNAMIC CALIBRATION USING COMPONENT-BASED FU...

BLOCK FAMILY-BASED ERROR AVOIDANCE FOR MEMORY DEVICES

OPEN BLOCK FAMILY DURATION LIMITED BY TEMPERATURE VARIATION

TRACKING AND REFRESHING STATE METRICS IN MEMORY SUB-SYSTEMS

DETERMINATION OF STATE METRICS OF MEMORY SUB-SYSTEMS FOLLOWING POWE...

OPEN BLOCK FAMILY DURATION LIMITED BY TIME AND TEMPERATURE

THRESHOLD VOLTAGE OFFSET BIN SELECTION BASED ON DIE FAMILY IN MEMOR...

MEMORY SUB-SYSTEM WITH DYNAMIC CALIBRATION USING COMPONENT-BASED FU...

FIRST-PASS CONTINUOUS READ LEVEL CALIBRATION

GENERATING EMBEDDED DATA IN MEMORY CELLS IN A MEMORY SUB-SYSTEM

DYNAMIC BACKGROUND SCAN OPTIMIZATION IN A MEMORY SUB-SYSTEM

ADJUSTMENT OF A STARTING VOLTAGE CORRESPONDING TO A PROGRAM OPERATI...

ASSOCIATING MULTIPLE CURSORS WITH BLOCK FAMILY OF MEMORY DEVICE

VOLTAGE BIN BOUNDARY CALIBRATION AT MEMORY DEVICE POWER UP

OFFSET MEMORY COMPONENT AUTOMATIC CALIBRATION (AUTOCAL) ERROR RECOV...

COMBINING SETS OF MEMORY BLOCKS IN A MEMORY DEVICE

MEMORY DEVICE WITH DYNAMIC PROGRAM-VERIFY VOLTAGE CALIBRATION

DYNAMIC PROGRAM ERASE TARGETING WITH BIT ERROR RATE

MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION

DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT

READ SAMPLE OFFSET BIT DETERMINATION IN A MEMORY SUB-SYSTEM

WRITE DATA FOR BIN RESYNCHRONIZATION AFTER POWER LOSS

MEMORY SUB-SYSTEM WITH BACKGROUND SCAN AND HISTOGRAM STATISTICS

ERROR-HANDLING FLOWS IN MEMORY DEVICES BASED ON BINS

TEMPERATURE-BASED BLOCK FAMILY COMBINATIONS IN A MEMORY DEVICE

MULTIPLE OPEN BLOCK FAMILIES SUPPORTING MULTIPLE CURSORS OF A MEMOR...