Bruce D. Baker

Person

Olivenhain, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Learning method and apparatus for detecting and controlling solder...
- Patent number 5,621,811
- Issue date Apr 15, 1997
- Hewlett-Packard Co.
- Paul A. Roder
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting electrical connections
- Patent number 5,561,696
- Issue date Oct 1, 1996
- Hewlett-Packard Company
- John A. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting excess/insufficient solder defects
- Patent number 5,291,535
- Issue date Mar 1, 1994
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Laminography system and method with electromagnetically directed mu...
- Patent number 5,259,012
- Issue date Nov 2, 1993
- Four PI Systems Corporation
- Bruce D. Baker
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for high resolution inspection of electronic i...
- Patent number 5,199,054
- Issue date Mar 30, 1993
- Four PI Systems Corporation
- John A. Adams
- G01 - MEASURING TESTING
Information Patent Grant
Automated laminography system for inspection of electronics
- Patent number 5,097,492
- Issue date Mar 17, 1992
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Automated laminography system for inspection of electronics
- Patent number 5,081,656
- Issue date Jan 14, 1992
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING
Information Patent Grant
Automated laminography system for inspection of electronics
- Patent number 4,926,452
- Issue date May 15, 1990
- Four PI Systems Corporation
- Bruce D. Baker
- G01 - MEASURING TESTING

Bruce D. Baker

Person

Patents Grantslast 30 patents

Learning method and apparatus for detecting and controlling solder...

Method and apparatus for inspecting electrical connections

Method and apparatus for detecting excess/insufficient solder defects

Laminography system and method with electromagnetically directed mu...

Method and apparatus for high resolution inspection of electronic i...

Automated laminography system for inspection of electronics

Automated laminography system for inspection of electronics

Automated laminography system for inspection of electronics