Bruce D. Quimby

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometry ION source
- Patent number 12,033,843
- Issue date Jul 9, 2024
- Agilent Technologies, Inc.
- Bruce D. Quimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ conditioning in mass spectrometer systems
- Patent number 8,513,593
- Issue date Aug 20, 2013
- Agilent Technologies, Inc.
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
In-situ conditioning in mass spectrometer systems
- Patent number 8,378,293
- Issue date Feb 19, 2013
- Agilent Technologies, Inc.
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
System for integrated backflush in a gas chromatograph
- Patent number 8,210,026
- Issue date Jul 3, 2012
- Agilent Technologies, Inc.
- Matthew S. Klee
- G01 - MEASURING TESTING
Information Patent Grant
Flame photometric detector having improved sensitivity
- Patent number 7,906,071
- Issue date Mar 15, 2011
- Agilent Technologies, Inc.
- Andrew Martin Warchol
- G01 - MEASURING TESTING
Information Patent Grant
Connector for analytical devices
- Patent number 7,507,336
- Issue date Mar 24, 2009
- Agilent Technologies, Inc.
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
Electronically controlled back pressure regulator
- Patent number 7,258,132
- Issue date Aug 21, 2007
- Agilent Technologies, Inc.
- Robert Clark Henderson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of matching retention times among multiple chromatographic s...
- Patent number 6,915,227
- Issue date Jul 5, 2005
- Agilent Technologies, Inc.
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
Method of matching retention times among multiple chromatographic s...
- Patent number 6,691,053
- Issue date Feb 10, 2004
- Agilent Technologies, Inc.
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
Methods for sample identification using pattern recognition under l...
- Patent number 6,493,639
- Issue date Dec 10, 2002
- Agilent Technologies, Inc.
- Matthew S. Klee
- G01 - MEASURING TESTING
Information Patent Grant
Retention factor database
- Patent number 6,153,438
- Issue date Nov 28, 2000
- Hewlett-Packard Company
- Leonid M. Blumberg
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and article of manufacture for enhanced intergra...
- Patent number 6,112,161
- Issue date Aug 29, 2000
- Hewlett-Packard
- Paul C. Dryden
- G01 - MEASURING TESTING
Information Patent Grant
Automated retention time locking
- Patent number 5,987,959
- Issue date Nov 23, 1999
- Hewlett-Packard Company
- Matthew S. Klee
- G01 - MEASURING TESTING
Information Patent Grant
Method for sample identification using a locked retention time data...
- Patent number 5,827,946
- Issue date Oct 27, 1998
- Hewlett-Packard Company
- Matthew S. Klee
- G01 - MEASURING TESTING
Information Patent Grant
Method and scavenger gas for the analysis of oxygen-containing comp...
- Patent number 5,151,371
- Issue date Sep 29, 1992
- Hewlett-Packard Company
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
Method and reagent gas for the analysis of nitrogen-containing comp...
- Patent number 4,776,690
- Issue date Oct 11, 1988
- Hewlett-Packard Company
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Grant
Water-cooled gas discharge detector
- Patent number 4,654,504
- Issue date Mar 31, 1987
- Hewlett-Packard Company
- James J. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Solvent dumping apparatus
- Patent number 4,517,824
- Issue date May 21, 1985
- Hewlett-Packard Company
- Bruce D. Quimby
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION SOURCE
- Publication number 20240339313
- Publication date Oct 10, 2024
- Agilent Technologies, Inc.
- Bruce D. QUIMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20210305036
- Publication date Sep 30, 2021
- Agilent Technologies, Inc.
- Bruce D. Quimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS
- Publication number 20130099113
- Publication date Apr 25, 2013
- AGILENT TECHNOLOGIES, INC.
- BRUCE D. QUIMBY
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS
- Publication number 20130062515
- Publication date Mar 14, 2013
- AGILENT TECHNOLOGIES, INC.
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Application
ION SELECTION OPTIMIZATION FOR MASS SPECTROMETRY
- Publication number 20120318970
- Publication date Dec 20, 2012
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Application
System For Integrated Backflush In A Gas Chromatograph
- Publication number 20100139363
- Publication date Jun 10, 2010
- Matthew S. Klee
- G01 - MEASURING TESTING
Information Patent Application
Connector for analytical devices
- Publication number 20060237353
- Publication date Oct 26, 2006
- Bruce D. Quimby
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Flame photometric detector having improved sensitivity
- Publication number 20060153734
- Publication date Jul 13, 2006
- Andrew Martin Warchol
- G01 - MEASURING TESTING
Information Patent Application
Efficient fluid coupling and method
- Publication number 20060038402
- Publication date Feb 23, 2006
- Wesley Miles Norman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Electronically controlled back pressure regulator
- Publication number 20050279408
- Publication date Dec 22, 2005
- Robert Clark Henderson
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of matching retention times among multiple chromatographic s...
- Publication number 20040122611
- Publication date Jun 24, 2004
- Bruce D. Quimby
- G01 - MEASURING TESTING
Information Patent Application
Method of matching retention times among multiple chromatographic s...
- Publication number 20030110000
- Publication date Jun 12, 2003
- Bruce D. Quimby
- G01 - MEASURING TESTING

Bruce D. Quimby

Person

Patents Grantslast 30 patents

Mass spectrometry ION source

In-situ conditioning in mass spectrometer systems

In-situ conditioning in mass spectrometer systems

System for integrated backflush in a gas chromatograph

Flame photometric detector having improved sensitivity

Connector for analytical devices

Electronically controlled back pressure regulator

Method of matching retention times among multiple chromatographic s...

Method of matching retention times among multiple chromatographic s...

Methods for sample identification using pattern recognition under l...

Retention factor database

Method, apparatus, and article of manufacture for enhanced intergra...

Automated retention time locking

Method for sample identification using a locked retention time data...

Method and scavenger gas for the analysis of oxygen-containing comp...

Method and reagent gas for the analysis of nitrogen-containing comp...

Water-cooled gas discharge detector

Solvent dumping apparatus

Patents Applicationslast 30 patents

ION SOURCE

ION SOURCE

IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS

IN-SITU CONDITIONING IN MASS SPECTROMETER SYSTEMS

ION SELECTION OPTIMIZATION FOR MASS SPECTROMETRY

System For Integrated Backflush In A Gas Chromatograph

Connector for analytical devices

Flame photometric detector having improved sensitivity

Efficient fluid coupling and method

Electronically controlled back pressure regulator

Method of matching retention times among multiple chromatographic s...

Method of matching retention times among multiple chromatographic s...