Bruce D. Sudweeks

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing non-deterministic device data
- Patent number 7,509,226
- Issue date Mar 24, 2009
- Teradyne, Inc.
- Jonathan M. Hops
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for performing serial and parallel scan testin...
- Patent number 5,606,568
- Issue date Feb 25, 1997
- Megatest Corporation
- Bruce D. Sudweeks
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for testing non-deterministic device data
- Publication number 20060116840
- Publication date Jun 1, 2006
- Jonathan M. Hops
- H04 - ELECTRIC COMMUNICATION TECHNIQUE