Bruce J. Ditmyer

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Endwell, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Generating test coverage bin based on simulation result
- Patent number 7,831,879
- Issue date Nov 9, 2010
- International Business Machines Corporation
- Bruce J. Ditmyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calculating AC chip performance using the LSSD scan path
- Patent number 5,039,939
- Issue date Aug 13, 1991
- International Business Machines Corporation
- Carroll J. Dick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GENERATING TEST COVERAGE BIN BASED ON SIMULATION RESULT
- Publication number 20090210746
- Publication date Aug 20, 2009
- Bruce J. Ditmyer
- G06 - COMPUTING CALCULATING COUNTING