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Bruce Schurmann
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Andover, MA, US
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last 30 patents
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Patent Grant
Scan testing a digital system using scan chains in integrated circuits
Patent number
4,947,357
Issue date
Aug 7, 1990
STellar Computer, Inc.
W. Kem Stewart
G01 - MEASURING TESTING
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Patent Grant
Iterative real-time XY raster path generator for bounded areas
Patent number
4,896,283
Issue date
Jan 23, 1990
Hewlett-Packard Company
Harry F. Hunt
G06 - COMPUTING CALCULATING COUNTING