Bruce W. Balch

Person

Saranac, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods for normalizing strain in semicondcutor devices and strain...
- Patent number 9,082,875
- Issue date Jul 14, 2015
- International Business Machines Corporation
- Bruce Balch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for measuring integrated circuit power supply noi...
- Patent number 8,521,500
- Issue date Aug 27, 2013
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Grant
Methods for normalizing strain in semiconductor devices and strain...
- Patent number 8,298,876
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Bruce Balch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage island performance/leakage screen monitor for IP characteri...
- Patent number 8,020,138
- Issue date Sep 13, 2011
- International Business Machines Corporation
- Bruce Balch
- G01 - MEASURING TESTING
Information Patent Grant
Across reticle variation modeling and related reticle
- Patent number 7,803,644
- Issue date Sep 28, 2010
- International Business Machines Corporation
- Bruce W. Balch
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR NORMALIZING STRAIN IN SEMICONDCUTOR DEVICES AND STRAIN...
- Publication number 20130032894
- Publication date Feb 7, 2013
- International Business Machines Corporation
- Bruce Balch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MEASURING INTEGRATED CIRCUIT POWER SUPPLY NOI...
- Publication number 20120049947
- Publication date Mar 1, 2012
- International Business Machines Corporation
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods for Normalizing Strain in Semiconductor Devices and Strain...
- Publication number 20100244132
- Publication date Sep 30, 2010
- International Business Machines Corporation
- Bruce Balch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monitoring NFET/PFET Skew in Complementary Metal Oxide Semiconducto...
- Publication number 20100174503
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Bruce Balch
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE ISLAND PERFORMANCE/LEAKAGE SCREEN MONITOR FOR IP CHARACTERI...
- Publication number 20090295402
- Publication date Dec 3, 2009
- International Business Machines Corporation
- Bruce Balch
- G01 - MEASURING TESTING
Information Patent Application
ACROSS RETICLE VARIATION MODELING AND RELATED RETICLE
- Publication number 20090068772
- Publication date Mar 12, 2009
- International Business Machines Corporation
- Bruce W. Balch
- H01 - BASIC ELECTRIC ELEMENTS

Bruce W. Balch

Person

Patents Grantslast 30 patents

Methods for normalizing strain in semicondcutor devices and strain...

Method and device for measuring integrated circuit power supply noi...

Methods for normalizing strain in semiconductor devices and strain...

Voltage island performance/leakage screen monitor for IP characteri...

Across reticle variation modeling and related reticle

Patents Applicationslast 30 patents

METHODS FOR NORMALIZING STRAIN IN SEMICONDCUTOR DEVICES AND STRAIN...

METHOD AND DEVICE FOR MEASURING INTEGRATED CIRCUIT POWER SUPPLY NOI...

Methods for Normalizing Strain in Semiconductor Devices and Strain...

Monitoring NFET/PFET Skew in Complementary Metal Oxide Semiconducto...

VOLTAGE ISLAND PERFORMANCE/LEAKAGE SCREEN MONITOR FOR IP CHARACTERI...

ACROSS RETICLE VARIATION MODELING AND RELATED RETICLE