Bruno A.R. Vrebos

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Almelo, NL

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative X-ray analysis—multi optical path instrument
- Patent number 9,739,730
- Issue date Aug 22, 2017
- PANalytical B.V.
- Petronella Emerentiana Hegeman
- G01 - MEASURING TESTING
Information Patent Grant
Examination of material samples
- Patent number 7,042,978
- Issue date May 9, 2006
- PANalytical B.V.
- Roelof De Lange
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for simultaneous X-ray diffraction and X-ray fluorescence...
- Patent number 5,745,543
- Issue date Apr 28, 1998
- U.S. Philips Corporation
- Pieter K. De Bokx
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for X-ray Fluorescence Analysis
- Publication number 20220365008
- Publication date Nov 17, 2022
- MALVERN PANALYTICAL B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Application
Pressed Powder Sample Measurements Using X-ray Fluorescence
- Publication number 20180348150
- Publication date Dec 6, 2018
- MALVERN PANALYTICAL B.V.
- Bruno Alfred Robert VREBOS
- G01 - MEASURING TESTING
Information Patent Application
Quantitative X-ray Analysis - Multi optical path instrument
- Publication number 20160258892
- Publication date Sep 8, 2016
- PANALYTICAL B.V.
- Petronella Emerentiana Hegeman
- G01 - MEASURING TESTING
Information Patent Application
Examination of material samples
- Publication number 20040234029
- Publication date Nov 25, 2004
- Roelof De Lange
- G01 - MEASURING TESTING