Bruno J. Debeurre

Person

Phoenix, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compensation and calibration of multiple mass MEMS sensor
- Patent number 10,012,673
- Issue date Jul 3, 2018
- NXP USA, INC.
- Tehmoor M. Dar
- G01 - MEASURING TESTING
Information Patent Grant
Compensation and calibration for MEMS devices
- Patent number 9,834,438
- Issue date Dec 5, 2017
- NXP USA, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Compensation and calibration of multiple mass MEMS sensor
- Patent number 9,797,921
- Issue date Oct 24, 2017
- NXP USA, INC.
- Tehmoor M. Dar
- G01 - MEASURING TESTING
Information Patent Grant
Methodology and system for wafer-level testing of MEMS pressure sen...
- Patent number 9,527,731
- Issue date Dec 27, 2016
- NXP USA, INC.
- Bruno J. Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS parameter identification using modulated waveforms
- Patent number 9,475,689
- Issue date Oct 25, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS parameter identification using modulated waveforms
- Patent number 9,335,340
- Issue date May 10, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Grant
MCU-based compensation and calibration for MEMS devices
- Patent number 9,335,396
- Issue date May 10, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Bruno Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Test structure and methodology for estimating sensitivity of pressu...
- Patent number 9,285,404
- Issue date Mar 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Compensation and calibration for MEMS devices
- Patent number 9,221,679
- Issue date Dec 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Organic semiconductor sensor device
- Patent number 8,569,809
- Issue date Oct 29, 2013
- STMicroelectronics, Inc.
- Danielle A. Thomas
- G01 - MEASURING TESTING
Information Patent Grant
Organic semiconductor sensor device
- Patent number 7,141,839
- Issue date Nov 28, 2006
- STMicroelectronics, Inc.
- Danielle A. Thomas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Organic semiconductor sensor device
- Patent number 6,852,996
- Issue date Feb 8, 2005
- STMicroelectronics, Inc.
- Danielle A. Thomas
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR
- Publication number 20180003734
- Publication date Jan 4, 2018
- NXP USA, Inc.
- Tehmoor M. Dar
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR
- Publication number 20170067932
- Publication date Mar 9, 2017
- FREESCALE SEMICONDUCTOR, INC.
- TEHMOOR M. DAR
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE WITH MULTI-STIMULUS SENSING AND METHOD OF FABRICATION
- Publication number 20160264403
- Publication date Sep 15, 2016
- FREESCALE SEMICONDUCTO, INC.
- MAMUR CHOWDHURY
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
COMPENSATION AND CALIBRATION FOR MEMS DEVICES
- Publication number 20160167961
- Publication date Jun 16, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
- Publication number 20160152464
- Publication date Jun 2, 2016
- FREESCALE SEMICONDUCTOR, INC.
- RAIMONDO P. SESSEGO
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS
- Publication number 20160116361
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...
- Publication number 20160107887
- Publication date Apr 21, 2016
- FREESCALE SEMICONDUCTOR, INC.
- BRUNO J. DEBEURRE
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
TEST STRUCTURE AND METHODOLOGY FOR ESTIMATING SENSITIVITY OF PRESSU...
- Publication number 20150048848
- Publication date Feb 19, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Chad S. Dawson
- G01 - MEASURING TESTING
Information Patent Application
MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
- Publication number 20150027198
- Publication date Jan 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Raimondo P. Sessego
- G01 - MEASURING TESTING
Information Patent Application
COMPENSATION AND CALIBRATION FOR MEMS DEVICES
- Publication number 20140260508
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Tehmoor M. Dar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MCU-BASED COMPENSATION AND CALIBRATION FOR MEMS DEVICES
- Publication number 20140266246
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Bruno Debeurre
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Organic semiconductor sensor device
- Publication number 20070029583
- Publication date Feb 8, 2007
- Danielle A. Thomas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Organic semiconductor sensor device
- Publication number 20040056245
- Publication date Mar 25, 2004
- Danielle A. Thomas
- G06 - COMPUTING CALCULATING COUNTING

Bruno J. Debeurre

Person

Patents Grantslast 30 patents

Compensation and calibration of multiple mass MEMS sensor

Compensation and calibration for MEMS devices

Compensation and calibration of multiple mass MEMS sensor

Methodology and system for wafer-level testing of MEMS pressure sen...

MEMS parameter identification using modulated waveforms

MEMS parameter identification using modulated waveforms

MCU-based compensation and calibration for MEMS devices

Test structure and methodology for estimating sensitivity of pressu...

Compensation and calibration for MEMS devices

Organic semiconductor sensor device

Organic semiconductor sensor device

Organic semiconductor sensor device

Patents Applicationslast 30 patents

COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR

COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR

SENSOR DEVICE WITH MULTI-STIMULUS SENSING AND METHOD OF FABRICATION

COMPENSATION AND CALIBRATION FOR MEMS DEVICES

MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS

SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SENSORS

METHODOLOGY AND SYSTEM FOR WAFER-LEVEL TESTING OF MEMS PRESSURE SEN...

TEST STRUCTURE AND METHODOLOGY FOR ESTIMATING SENSITIVITY OF PRESSU...

MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS

COMPENSATION AND CALIBRATION FOR MEMS DEVICES

MCU-BASED COMPENSATION AND CALIBRATION FOR MEMS DEVICES

Organic semiconductor sensor device

Organic semiconductor sensor device