Bruno Roberto Aimi

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Williston, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Fabrication, testing and repair of multichip semiconductor structur...
- Patent number 5,679,609
- Issue date Oct 21, 1997
- International Business Machines Corporation
- Bruno Roberto Aimi
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication, testing and repair of multichip semiconductor structur...
- Patent number 5,661,330
- Issue date Aug 26, 1997
- International Business Machines Corporation
- Bruno Roberto Aimi
- G01 - MEASURING TESTING
Information Patent Grant
Connections between circuit chips and a temporary carrier for use i...
- Patent number 5,237,269
- Issue date Aug 17, 1993
- International Business Machines Corporation
- Bruno R. Aimi
- G01 - MEASURING TESTING