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Bryan D. Boswell
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Loveland, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for determining a self-discharge current charac...
Patent number
10,330,715
Issue date
Jun 25, 2019
Keysight Technologies, Inc.
Edward Brorein
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic switch contact protection
Patent number
8,922,957
Issue date
Dec 30, 2014
Keysight Technologies, Inc.
Bryan D. Boswell
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Pulse generator with precision edge placement
Patent number
7,977,996
Issue date
Jul 12, 2011
Agilent Technologies, Inc.
David Paul Kjosness
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Controlling electronics across an RF barrier using a serial interfa...
Patent number
6,813,646
Issue date
Nov 2, 2004
Agilent Technologies, Inc.
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Grant
RF fixture electronics for testing RF devices
Patent number
6,751,570
Issue date
Jun 15, 2004
Agilent Technologies, Inc.
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Grant
RF isolation test device having ease of accessibility
Patent number
6,563,297
Issue date
May 13, 2003
Agilent Technologies, Inc.
Bryan D. Boswell
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
RF isolation test device accommodating multiple nest plates for tes...
Patent number
6,545,459
Issue date
Apr 8, 2003
Agilent Technologies, Inc.
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Grant
RF isolation test device accommodating multiple nest plates for tes...
Patent number
6,469,495
Issue date
Oct 22, 2002
Agilent Technologies, Inc.
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Grant
RF isolation test device having a box within a box configuration fo...
Patent number
6,377,038
Issue date
Apr 23, 2002
Agilent Technologies, Inc.
Bryan D. Boswell
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System and method for detecting shorts, opens and connected pins on...
Patent number
6,291,978
Issue date
Sep 18, 2001
Agilent Technologies, Inc.
Kevin G. Chandler
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting shorts, opens and connected pins on...
Patent number
6,191,570
Issue date
Feb 20, 2001
Agilent Technologies, Inc.
Kevin G. Chandler
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting shorts, opens and connected pins on...
Patent number
6,051,979
Issue date
Apr 18, 2000
Hewlett-Packard Company
Kevin G. Chandler
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting shorts, opens and connected pins on...
Patent number
5,977,775
Issue date
Nov 2, 1999
Hewlett-Packard Company
Kevin G. Chandler
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detecting short, opens and connected pins on...
Patent number
5,504,432
Issue date
Apr 2, 1996
Hewlett-Packard Company
Kevin G. Chandler
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR DETERMINING A SELF-DISCHARGE CURRENT CHARAC...
Publication number
20180164363
Publication date
Jun 14, 2018
Keysight Technologies, Inc.
Edward Brorein
G01 - MEASURING TESTING
Information
Patent Application
Dynamic Switch Contact Protection
Publication number
20090274051
Publication date
Nov 5, 2009
AGILENT TECHNOLOGIES, INC.
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Application
RF fixture electronics for testing RF devices
Publication number
20030083839
Publication date
May 1, 2003
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Application
Controlling electronics across an RF barrier using a serial interfa...
Publication number
20030082959
Publication date
May 1, 2003
Bryan D. Boswell
G01 - MEASURING TESTING
Information
Patent Application
RF isolation test device accommodating multiple nest plates for tes...
Publication number
20020074993
Publication date
Jun 20, 2002
Bryan D. Boswell
G01 - MEASURING TESTING