Bryan D. Schmidt

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San Antonio, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for removing particles from semiconductor wafe...
- Patent number 5,972,051
- Issue date Oct 26, 1999
- VLSI Technology, Inc.
- Pierre Leroux
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer defect monitoring
- Patent number 5,392,113
- Issue date Feb 21, 1995
- VLSI Technology, Inc.
- Anthony Sayka
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic apparatus and method for removing particles from semi...
- Patent number 5,350,428
- Issue date Sep 27, 1994
- VLSI Technology, Inc.
- Pierre Leroux
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for thermally insulating a wafer support
- Patent number 5,343,938
- Issue date Sep 6, 1994
- VLSI Technology, Inc.
- Bryan D. Schmidt
- F28 - HEAT EXCHANGE IN GENERAL