Los Altos Hills, CA, US
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Patent Grant
Pria Diagnostics, Inc.
Alexander M. Aravanis
G01 - MEASURING TESTING
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Patent Grant
Robert E. Parks
G01 - MEASURING TESTING
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Patent Grant
Silicon Graphics, Inc.
Henry P. Moreton
G02 - OPTICS
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Patent Grant
K Laser Technology, Inc.
Bryan E. Loucks
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Grant
Kopin Corporation
Bryan E. Loucks
G02 - OPTICS
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Patent Grant
Silicon Light Machines
Bryan P. Staker
G02 - OPTICS
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Patent Grant
Kopin Corporation
Bryan E. Loucks
G02 - OPTICS
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Patent Grant
Greyhawk Systems, Inc.
Frederic J. Kahn
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Greyhawk Systems, Inc.
Ronald F. Zampolin
G02 - OPTICS
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Patent Grant
Greyhawk Systems, Inc.
Bryan E. Loucks
G02 - OPTICS
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Patent Grant
Greyhawk Systems, Inc.
Frederic J. Kahn
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Sharp Corporation
Frederic J. Kahn
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Greyhawk Systems, Inc.
Robert P. Harshberger
G05 - CONTROLLING REGULATING
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Patent Grant
Greyhawk Systems
Robert P. Harshberger
G05 - CONTROLLING REGULATING
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Patent Grant
Greyhawk Systems, Inc.
Bryan E. Loucks
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Patent Application
Alexander M. Aravanis
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Robert E. Parks
G01 - MEASURING TESTING
