Bryan Edward Cole

Person

Cambridge, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Test system
- Patent number 11,921,154
- Issue date Mar 5, 2024
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,726,136
- Issue date Aug 15, 2023
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Test system for testing the integrity of an electronic device
- Patent number 11,366,158
- Issue date Jun 21, 2022
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Test system
- Patent number 11,169,202
- Issue date Nov 9, 2021
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 10,076,261
- Issue date Sep 18, 2018
- TeraView Limited
- Donald Dominic Arnone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Test system
- Patent number 10,006,960
- Issue date Jun 26, 2018
- TeraView Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Imaging techniques and associated apparatus
- Patent number 9,829,433
- Issue date Nov 28, 2017
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
TeraHertz probe array imaging system
- Patent number 9,075,002
- Issue date Jul 7, 2015
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Scanning terahertz probe
- Patent number 9,006,660
- Issue date Apr 14, 2015
- TeraView Limited
- Bryan Edward Cole
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for investigating a non-planar sample
- Patent number 8,665,423
- Issue date Mar 4, 2014
- TeraView Limited
- Michael J. Withers
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopy apparatus and associated technique
- Patent number 7,728,296
- Issue date Jun 1, 2010
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for investigating a sample
- Patent number 7,485,863
- Issue date Feb 3, 2009
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Coherent THz emitter with DC power reducing resistor
- Patent number 7,397,428
- Issue date Jul 8, 2008
- TeraView Limited
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 7,335,883
- Issue date Feb 26, 2008
- Teraview Limited
- Vincent Patrick Wallace
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Probe apparatus and method for examining a sample
- Patent number 7,315,175
- Issue date Jan 1, 2008
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating a sample
- Patent number 7,214,940
- Issue date May 8, 2007
- Teraview Limited
- Julian Alexander Cluff
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 7,174,037
- Issue date Feb 6, 2007
- Teraview Limited
- Donald Dominic Arnone
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and method
- Patent number 7,152,007
- Issue date Dec 19, 2006
- Tera View Limited
- Donald Dominic Arnone
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for investigating a sample
- Patent number 6,865,014
- Issue date Mar 8, 2005
- Teraview Limited
- Craig Michael Ciesla
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CURVATURE CORRECTION
- Publication number 20240328781
- Publication date Oct 3, 2024
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20230324452
- Publication date Oct 12, 2023
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220268833
- Publication date Aug 25, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20220026482
- Publication date Jan 27, 2022
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
A TEST SYSTEM
- Publication number 20180364301
- Publication date Dec 20, 2018
- TERAVIEW LIMITED
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20180275190
- Publication date Sep 27, 2018
- Teraview Limited
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM
- Publication number 20140021963
- Publication date Jan 23, 2014
- TERAVIEW LIMITED
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TERAHERTZ PROBE
- Publication number 20110028824
- Publication date Feb 3, 2011
- Bryan Edward Cole
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Terahertz Time Domain Sensing to Derive Physical Characteristics of...
- Publication number 20080037031
- Publication date Feb 14, 2008
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Investigating a Non-Planar Sample
- Publication number 20070257216
- Publication date Nov 8, 2007
- Michael J. Withers
- G01 - MEASURING TESTING
Information Patent Application
Terahertz probe array imaging system
- Publication number 20070158571
- Publication date Jul 12, 2007
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for investigating a sample
- Publication number 20070138392
- Publication date Jun 21, 2007
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopy apparatus and associated technique
- Publication number 20060255277
- Publication date Nov 16, 2006
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Application
Imaging techniques and associated apparatus
- Publication number 20060235621
- Publication date Oct 19, 2006
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Application
Coherent thz emitter with dc power reducing resistor
- Publication number 20060151722
- Publication date Jul 13, 2006
- Bryan E. Cole
- G01 - MEASURING TESTING
Information Patent Application
Imaging apparatus and method
- Publication number 20050082479
- Publication date Apr 21, 2005
- Vincent Patrick Wallace
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Imaging apparatus and method
- Publication number 20040155665
- Publication date Aug 12, 2004
- Tera View Limited
- Donald Dominic Arnone
- G01 - MEASURING TESTING
Information Patent Application
Probe apparatus and method for examining a sample
- Publication number 20040095147
- Publication date May 20, 2004
- Bryan Edward Cole
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for investigating a sample
- Publication number 20040065832
- Publication date Apr 8, 2004
- Julian Alexander Cluff
- G02 - OPTICS
Information Patent Application
Imaging apparatus and method
- Publication number 20030178584
- Publication date Sep 25, 2003
- Donald Dominic Arnone
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for investigating a sample
- Publication number 20030165003
- Publication date Sep 4, 2003
- Craig Michael Ciesla
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for investigating a sample
- Publication number 20030155512
- Publication date Aug 21, 2003
- Donald Dominic Arnone
- G01 - MEASURING TESTING
Information Patent Application
Imaging apparatus and method
- Publication number 20030149346
- Publication date Aug 7, 2003
- Donald Dominic Arnone
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Bryan Edward Cole

Person

Patents Grantslast 30 patents

Test system

Test system

Test system for testing the integrity of an electronic device

Test system

Imaging apparatus and method

Test system

Imaging techniques and associated apparatus

TeraHertz probe array imaging system

Scanning terahertz probe

Method and apparatus for investigating a non-planar sample

Spectroscopy apparatus and associated technique

Method and apparatus for investigating a sample

Coherent THz emitter with DC power reducing resistor

Imaging apparatus and method

Probe apparatus and method for examining a sample

Apparatus and method for investigating a sample

Imaging apparatus and method

Imaging apparatus and method

Apparatus and method for investigating a sample

Patents Applicationslast 30 patents

CURVATURE CORRECTION

TEST SYSTEM

TEST SYSTEM

TEST SYSTEM

A TEST SYSTEM

TEST SYSTEM

TEST SYSTEM

SCANNING TERAHERTZ PROBE

Terahertz Time Domain Sensing to Derive Physical Characteristics of...

Method and Apparatus for Investigating a Non-Planar Sample

Terahertz probe array imaging system

Method and apparatus for investigating a sample

Spectroscopy apparatus and associated technique

Imaging techniques and associated apparatus

Coherent thz emitter with dc power reducing resistor

Imaging apparatus and method

Imaging apparatus and method

Probe apparatus and method for examining a sample

Apparatus and method for investigating a sample

Imaging apparatus and method

Apparatus and method for investigating a sample

Apparatus and method for investigating a sample

Imaging apparatus and method