Bryan K. Choo

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Damascene metal-insulator-metal (MIM) device with improved scaleabi...
- Patent number 9,343,666
- Issue date May 17, 2016
- Cypress Semiconductor Corporation
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Damascene metal-insulator-metal (MIM) device with improved scaleabi...
- Patent number 8,232,175
- Issue date Jul 31, 2012
- Spansion LLC
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Damascene metal-insulator-metal (MIM) device
- Patent number 8,089,113
- Issue date Jan 3, 2012
- Spansion LLC
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin film germanium diode with low reverse breakdown
- Patent number 7,468,296
- Issue date Dec 23, 2008
- Spansion LLC
- Ercan Adem
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for visually monitoring a semiconductor processin...
- Patent number 7,173,648
- Issue date Feb 6, 2007
- Advanced Micro Devices, Inc.
- Khoi Phan
- G01 - MEASURING TESTING
Information Patent Grant
Concurrent measurement of critical dimension and overlay in semicon...
- Patent number 7,080,330
- Issue date Jul 18, 2006
- Advanced Micro Devices, Inc.
- Bryan Choo
- G01 - MEASURING TESTING
Information Patent Grant
Using scatterometry to obtain measurements of in circuit structures
- Patent number 6,912,438
- Issue date Jun 28, 2005
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G01 - MEASURING TESTING
Information Patent Grant
Use of scanning probe microscope for defect detection and repair
- Patent number 6,884,999
- Issue date Apr 26, 2005
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of OPC design factors utilizing an advanced algorithm...
- Patent number 6,829,380
- Issue date Dec 7, 2004
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Self-cleaning technique for contamination on calibration sample in SEM
- Patent number 6,635,874
- Issue date Oct 21, 2003
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate development
- Patent number 6,634,805
- Issue date Oct 21, 2003
- Advanced Micro Devices, Inc.
- Michael K. Templeton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for illuminating a semiconductor processing system
- Patent number 6,632,283
- Issue date Oct 14, 2003
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carbon nanotubes as linewidth standards for SEM & AFM
- Patent number 6,591,658
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- G01 - MEASURING TESTING
Information Patent Grant
System and method for illuminating a semiconductor processing system
- Patent number 6,572,252
- Issue date Jun 3, 2003
- Advanced Micro Devices, Inc.
- Bharath Rangarajan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam SEM for sidewall imaging
- Patent number 6,566,655
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring dimensions of a feature having a re...
- Patent number 6,559,446
- Issue date May 6, 2003
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G01 - MEASURING TESTING
Information Patent Grant
System and method to determine line edge roughness and/or linewidth
- Patent number 6,516,528
- Issue date Feb 11, 2003
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G01 - MEASURING TESTING
Information Patent Grant
Using localized ionizer to reduce electrostatic charge from wafer a...
- Patent number 6,507,474
- Issue date Jan 14, 2003
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electrostatic charge reduction of photoresist pattern on developmen...
- Patent number 6,479,820
- Issue date Nov 12, 2002
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cantilever assembly and scanning tip therefor with associated optic...
- Patent number 6,479,817
- Issue date Nov 12, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- G01 - MEASURING TESTING
Information Patent Grant
System and method of providing improved CD-SEM pattern recognition...
- Patent number 6,462,343
- Issue date Oct 8, 2002
- Advanced Micro Devices, Inc.
- Bryan K. Choo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Grainless material for calibration sample
- Patent number 6,459,482
- Issue date Oct 1, 2002
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carbon nanotube probes in atomic force microscope to detect partial...
- Patent number 6,455,847
- Issue date Sep 24, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having optical fiber spaced from point of hp
- Patent number 6,452,161
- Issue date Sep 17, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
UV-enhanced silylation process to increase etch resistance of ultra...
- Patent number 6,451,512
- Issue date Sep 17, 2002
- Advanced Micro Devices, Inc.
- Bharath Rangarajan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron beam flood exposure technique to reduce the carbon contami...
- Patent number 6,444,381
- Issue date Sep 3, 2002
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Use of carbon nanotubes as chemical sensors by incorporation of flu...
- Patent number 6,437,329
- Issue date Aug 20, 2002
- Advanced Micro Devices, Inc.
- Sanjay K. Yedur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cleaning carbon contamination on mask using gaseous phase
- Patent number 6,423,479
- Issue date Jul 23, 2002
- Advanced Micro Devices, Inc.
- Ramkumar Subramanian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Using a crystallographic etched silicon sample to measure and contr...
- Patent number 6,396,059
- Issue date May 28, 2002
- Advanced Micro Devices, Inc.
- Bhanwar Singh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ozone cleaning of wafers
- Patent number 6,371,134
- Issue date Apr 16, 2002
- Advanced Micro Devices, Inc.
- Ramkumar Subramanian
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DAMASCENE METAL-INSULATOR-METAL (MIM) DEVICE IMPROVED SCALEABILITY
- Publication number 20120276706
- Publication date Nov 1, 2012
- Suzette K. PANGRLE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Damascene metal-insulator-metal (MIM) device
- Publication number 20080132068
- Publication date Jun 5, 2008
- Spansion LLC, Advanced Micro Devices, Inc.
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Damascene metal-insulator-metal (MIM) device with improved scaleabi...
- Publication number 20080123401
- Publication date May 29, 2008
- Spansion LLC
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Using scatterometry to obtain measurements of in circuit structures
- Publication number 20040078108
- Publication date Apr 22, 2004
- Bryan K. Choo
- G01 - MEASURING TESTING
Information Patent Application
Ozone cleaning of wafers
- Publication number 20010010229
- Publication date Aug 2, 2001
- R. Subramanian
- Ramkumar Subramanian
- H01 - BASIC ELECTRIC ELEMENTS

Bryan K. Choo

Person

Patents Grantslast 30 patents

Damascene metal-insulator-metal (MIM) device with improved scaleabi...

Damascene metal-insulator-metal (MIM) device with improved scaleabi...

Damascene metal-insulator-metal (MIM) device

Thin film germanium diode with low reverse breakdown

System and method for visually monitoring a semiconductor processin...

Concurrent measurement of critical dimension and overlay in semicon...

Using scatterometry to obtain measurements of in circuit structures

Use of scanning probe microscope for defect detection and repair

Optimization of OPC design factors utilizing an advanced algorithm...

Self-cleaning technique for contamination on calibration sample in SEM

Parallel plate development

System and method for illuminating a semiconductor processing system

Carbon nanotubes as linewidth standards for SEM &#x00026; AFM

System and method for illuminating a semiconductor processing system

Multi-beam SEM for sidewall imaging

System and method for measuring dimensions of a feature having a re...

System and method to determine line edge roughness and/or linewidth

Using localized ionizer to reduce electrostatic charge from wafer a...

Electrostatic charge reduction of photoresist pattern on developmen...

Cantilever assembly and scanning tip therefor with associated optic...

System and method of providing improved CD-SEM pattern recognition...

Grainless material for calibration sample

Carbon nanotube probes in atomic force microscope to detect partial...

Scanning probe microscope having optical fiber spaced from point of hp

UV-enhanced silylation process to increase etch resistance of ultra...

Electron beam flood exposure technique to reduce the carbon contami...

Use of carbon nanotubes as chemical sensors by incorporation of flu...

Cleaning carbon contamination on mask using gaseous phase

Using a crystallographic etched silicon sample to measure and contr...

Ozone cleaning of wafers

Patents Applicationslast 30 patents

DAMASCENE METAL-INSULATOR-METAL (MIM) DEVICE IMPROVED SCALEABILITY

Damascene metal-insulator-metal (MIM) device

Damascene metal-insulator-metal (MIM) device with improved scaleabi...

Using scatterometry to obtain measurements of in circuit structures

Ozone cleaning of wafers

Carbon nanotubes as linewidth standards for SEM & AFM