Bryan Mitchell Tracy

Person

Oakland, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for performing failure analysis on a multilayer s...
- Patent number 6,812,049
- Issue date Nov 2, 2004
- Advanced Micro Devices, Inc.
- Bryan M. Tracy
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for using TMAH for staining copper silicon on ins...
- Patent number 6,770,512
- Issue date Aug 3, 2004
- Advanced Micro Devices, Inc.
- Mehrdad Mahanpour
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for reducing stress-induced voids for 0.25 μm micron...
- Patent number 6,534,869
- Issue date Mar 18, 2003
- Advanced Micro Devices, Inc.
- Bryan Tracy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer optical scanning system and method using swath-...
- Patent number 6,011,619
- Issue date Jan 4, 2000
- Advanced Micro Devices
- Paul J. Steffan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to improve electromigration performance by use...
- Patent number 5,882,738
- Issue date Mar 16, 1999
- Advanced Micro Devices, Inc.
- Richard C. Blish
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electron beam emitting tungsten filament
- Patent number 5,864,199
- Issue date Jan 26, 1999
- Advanced Micro Devices, Inc.
- Roger L. Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of fiducial marks for improved blank wafer defect review
- Patent number 5,847,821
- Issue date Dec 8, 1998
- Advanced Micro Devices, Inc.
- Bryan Mitchell Tracy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Copper reservoir for reducing electromigration effects associated w...
- Patent number 5,770,519
- Issue date Jun 23, 1998
- Advanced Micro Devices, Inc.
- Richard K. Klein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming electron beam emitting tungsten filament
- Patent number 5,727,978
- Issue date Mar 17, 1998
- Advanced Micro Devices, Inc.
- Roger L. Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temperature sensing probe for microthermometry
- Patent number 5,713,667
- Issue date Feb 3, 1998
- Advanced Micro Devices, Inc.
- Roger Alvis
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Copper pellet for reducing electromigration effects associated with...
- Patent number 5,646,448
- Issue date Jul 8, 1997
- Advanced Micro Devices
- Richard K. Klein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Copper pellet for reducing electromigration effects associated with...
- Patent number 5,639,691
- Issue date Jun 17, 1997
- Advanced Micro Devices, Inc.
- Richard K. Klein
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR REDUCING STRESS-INDUCED VOIDS FOR 0.25 MICRON AND SMALLE...
- Publication number 20010040295
- Publication date Nov 15, 2001
- BRYAN TRACY
- H01 - BASIC ELECTRIC ELEMENTS

Bryan Mitchell Tracy

Person

Patents Grantslast 30 patents

Method and system for performing failure analysis on a multilayer s...

Method and system for using TMAH for staining copper silicon on ins...

Method for reducing stress-induced voids for 0.25 &#x03BC;m micron...

Semiconductor wafer optical scanning system and method using swath-...

Apparatus and method to improve electromigration performance by use...

Electron beam emitting tungsten filament

Use of fiducial marks for improved blank wafer defect review

Copper reservoir for reducing electromigration effects associated w...

Method of forming electron beam emitting tungsten filament

Temperature sensing probe for microthermometry

Copper pellet for reducing electromigration effects associated with...

Copper pellet for reducing electromigration effects associated with...

Patents Applicationslast 30 patents

METHOD FOR REDUCING STRESS-INDUCED VOIDS FOR 0.25 MICRON AND SMALLE...

Method for reducing stress-induced voids for 0.25 μm micron...