Bryan W. Guenther

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Lens mount calibration mechanism for large camera
- Patent number 12,058,430
- Issue date Aug 6, 2024
- Sphere Entertainment Group, LLC
- Deanan Dasilva
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for flattening sample in optical metrology
- Patent number 10,006,839
- Issue date Jun 26, 2018
- Bruker Nano, Inc.
- Bryan Guenther
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automated re-focusing of interferometric reference mirror
- Patent number 9,664,501
- Issue date May 30, 2017
- Bruker Nano Inc.
- Erik Novak
- G01 - MEASURING TESTING
Information Patent Grant
Edge electrode for characterization of semiconductor wafers
- Patent number 9,442,133
- Issue date Sep 13, 2016
- Bruker Nano Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Fixture for flattening sample in optical metrology
- Patent number 9,303,631
- Issue date Apr 5, 2016
- BRUKE NANO INC.
- Bryan Guenther
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Automated re-focusing of interferometric reference mirror
- Patent number 9,234,814
- Issue date Jan 12, 2016
- Bruker Nano Inc.
- Erik Novak
- G01 - MEASURING TESTING
Information Patent Grant
Pneumatic counterbalance for optical head gantry
- Patent number 8,375,594
- Issue date Feb 19, 2013
- Bruker Nano Inc.
- Bryan W. Guenther
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Mounting mechanism for compensating optics in interferometer
- Patent number 7,212,356
- Issue date May 1, 2007
- Veeco Instruments Inc.
- Bryan W. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Automated minimization of optical path difference and reference mir...
- Patent number 6,552,806
- Issue date Apr 22, 2003
- Veeco Instruments Inc.
- Richard W. Swinford
- G01 - MEASURING TESTING
Information Patent Grant
Embedded interferometer for reference-mirror calibration of interfe...
- Patent number 6,545,761
- Issue date Apr 8, 2003
- Veeco Instruments, Inc.
- David J. Aziz
- G01 - MEASURING TESTING
Information Patent Grant
Self-centering crash protection mechanism for interference microsco...
- Patent number 6,266,183
- Issue date Jul 24, 2001
- Veeco Instruments Inc.
- Bryan W. Guenther
- G02 - OPTICS
Information Patent Grant
Orthogonal-scanning microscope objective for vertical-scanning and...
- Patent number 5,640,270
- Issue date Jun 17, 1997
- Wyko Corporation
- David J. Aziz
- G02 - OPTICS
Information Patent Grant
Combination of motorized and piezoelectric translation for long-ran...
- Patent number 5,446,547
- Issue date Aug 29, 1995
- Wyko Corporation
- Bryan W. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
Conformal coat contact insertion strip mask
- Patent number 5,044,312
- Issue date Sep 3, 1991
- Hughes Aircraft Company
- Bryan W. Guenther
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Patents Applicationslast 30 patents

Information Patent Application
LENS MOUNT CALIBRATION MECHANISM FOR LARGE CAMERA
- Publication number 20240323508
- Publication date Sep 26, 2024
- SPHERE ENTERTAINMENT GROUP, LLC
- Deanan DASILVA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CAMERA LENS FLEXURE COLLAR
- Publication number 20240053655
- Publication date Feb 15, 2024
- MSG Entertainment Group, LLC
- Michael GRAAE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LENS MOUNT CALIBRATION MECHANISM FOR LARGE CAMERA
- Publication number 20240056665
- Publication date Feb 15, 2024
- MSG Entertainment Group, LLC
- Deanan DASILVA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR FLATTENING SAMPLE IN OPTICAL METROLOGY
- Publication number 20160187234
- Publication date Jun 30, 2016
- BRYAN GUENTHER
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
AUTOMATED RE-FOCUSING OF INTERFEROMETRIC REFERENCE MIRROR
- Publication number 20160123719
- Publication date May 5, 2016
- ERIK NOVAK
- G01 - MEASURING TESTING
Information Patent Application
Mounting mechanism for compensating optics in interferometer
- Publication number 20060120088
- Publication date Jun 8, 2006
- Bryan W. Guenther
- G01 - MEASURING TESTING

Bryan W. Guenther

Person

Patents Grantslast 30 patents

Lens mount calibration mechanism for large camera

Method for flattening sample in optical metrology

Automated re-focusing of interferometric reference mirror

Edge electrode for characterization of semiconductor wafers

Fixture for flattening sample in optical metrology

Automated re-focusing of interferometric reference mirror

Pneumatic counterbalance for optical head gantry

Mounting mechanism for compensating optics in interferometer

Automated minimization of optical path difference and reference mir...

Embedded interferometer for reference-mirror calibration of interfe...

Self-centering crash protection mechanism for interference microsco...

Orthogonal-scanning microscope objective for vertical-scanning and...

Combination of motorized and piezoelectric translation for long-ran...

Conformal coat contact insertion strip mask

Patents Applicationslast 30 patents

LENS MOUNT CALIBRATION MECHANISM FOR LARGE CAMERA

CAMERA LENS FLEXURE COLLAR

LENS MOUNT CALIBRATION MECHANISM FOR LARGE CAMERA

METHOD FOR FLATTENING SAMPLE IN OPTICAL METROLOGY

AUTOMATED RE-FOCUSING OF INTERFEROMETRIC REFERENCE MIRROR

Mounting mechanism for compensating optics in interferometer