Bryan W. Reed

Person

San Leandro, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Arbitrary electron dose waveforms for electron microscopy
- Patent number 12,080,514
- Issue date Sep 3, 2024
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Shewmon Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for event modulated electron microscopy
- Patent number 11,848,173
- Issue date Dec 19, 2023
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan Walter Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High framerate and high dynamic range electron microscopy
- Patent number 11,804,359
- Issue date Oct 31, 2023
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arbitrary electron dose waveforms for electron microscopy
- Patent number 11,728,128
- Issue date Aug 15, 2023
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Shewmon Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,676,796
- Issue date Jun 13, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arbitrary electron dose waveforms for electron microscopy
- Patent number 11,476,082
- Issue date Oct 18, 2022
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Ruth Shewmon Bloom
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporal compressive sensing systems
- Patent number 10,571,675
- Issue date Feb 25, 2020
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan Reed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temporal compressive sensing systems
- Patent number 10,018,824
- Issue date Jul 10, 2018
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Grant
Temporal compressive sensing systems
- Patent number 9,841,592
- Issue date Dec 12, 2017
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan W. Reed
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY
- Publication number 20240355581
- Publication date Oct 24, 2024
- Integrated Dynamic Electron Solutions, Inc.
- Bryan Walter REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY
- Publication number 20240105418
- Publication date Mar 28, 2024
- Integrated Dynamic Electron Solutions, Inc.
- Ruth BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
- Publication number 20230411112
- Publication date Dec 21, 2023
- Integrated Dynamic Electron Solutions, Inc.
- Ruth Shewmon BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Image Generation Method
- Publication number 20230072991
- Publication date Mar 9, 2023
- JEOL Ltd.
- Hiroki Hashiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
- Publication number 20220406561
- Publication date Dec 22, 2022
- Integrated Dynamic Electron Solutions, Inc.
- Ruth Shewmon BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY
- Publication number 20220336185
- Publication date Oct 20, 2022
- Integrated Dynamic Electron Solutions, Inc.
- Ruth Shewmon BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220084783
- Publication date Mar 17, 2022
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY
- Publication number 20210082661
- Publication date Mar 18, 2021
- Integrated Dynamic Electron Solutions, Inc.
- Ruth BLOOM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20190204579
- Publication date Jul 4, 2019
- Integrated Dynamic Electron Solutions, Inc.
- Bryan Reed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20180136449
- Publication date May 17, 2018
- Integrated Dynamic Electron Solutions, Inc.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20170146787
- Publication date May 25, 2017
- Integrated Dynamic Electron Solutions, Inc.
- Bryan W. Reed
- G02 - OPTICS

Bryan W. Reed

Person

Patents Grantslast 30 patents

Arbitrary electron dose waveforms for electron microscopy

Methods and systems for event modulated electron microscopy

High framerate and high dynamic range electron microscopy

Arbitrary electron dose waveforms for electron microscopy

Charged particle beam device

Arbitrary electron dose waveforms for electron microscopy

Temporal compressive sensing systems

Temporal compressive sensing systems

Temporal compressive sensing systems

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR EVENT MODULATED ELECTRON MICROSCOPY

HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY

ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY

Charged Particle Beam Device and Image Generation Method

ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY

ARBITRARY ELECTRON DOSE WAVEFORMS FOR ELECTRON MICROSCOPY

Charged Particle Beam Device

HIGH FRAMERATE AND HIGH DYNAMIC RANGE ELECTRON MICROSCOPY

TEMPORAL COMPRESSIVE SENSING SYSTEMS

TEMPORAL COMPRESSIVE SENSING SYSTEMS

TEMPORAL COMPRESSIVE SENSING SYSTEMS